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Preparation method of UV LED and UV LED

A multi-quantum well and flow technology, applied in the direction of electrical components, circuits, semiconductor devices, etc., can solve the problems of difficult UVLED chip luminous color difference, stability, uniformity, and difficult to distinguish UVLED core particles, etc., to achieve good reliability Effect of dimming color, adjustable dominant wavelength, and controllable lumen intensity of dominant wavelength

Active Publication Date: 2021-03-19
MAANSHAN JASON SEMICON CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] UV LED emits visible light except for the 380-400nm band, and the other bands are invisible light; the light source emitted during work is basically invisible light, but due to unfavorable factors such as vacancies and impurity defects in the epitaxial growth process of the AlInGaN system, UV LED work Sometimes it will emit purple, blue, yellow and other stray light, and even directly emit white light. Due to the inconsistent stability and uniformity of defect control in the epitaxial growth process, it is difficult to unify the luminescent color difference of UV LED core particles between batches. At the same time, chip testing Binning is difficult to distinguish UV LED chips with color difference, and the luminous flux is also difficult to achieve consistency, resulting in visible color difference between batches or even within batches of packaged devices, and uneven brightness and darkness.

Method used

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  • Preparation method of UV LED and UV LED
  • Preparation method of UV LED and UV LED
  • Preparation method of UV LED and UV LED

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Embodiment 1

[0067] The UV LED of this embodiment and figure 2 Basically the same, the specific preparation process is as follows:

[0068] 1) At 200 Torr, raise the temperature of the MOCVD reaction chamber to 1080°C, and treat the (002) plane sapphire substrate 10 at high temperature for 5 minutes; cool down to 530°C for nitriding treatment, and respectively use TEGa, TMIn, TMAl, NH 3 As gallium source, indium source, aluminum source, nitrogen source, SiH 4 is an n-type dopant, Cp 2 Mg is the p-type dopant, with N 2 As the carrier gas, send various gas sources into the MOCVD reaction chamber; continue to grow a GaN layer with a thickness of 35nm at 530°C as the low-temperature buffer layer 11; raise the temperature to 1080°C, and grow a GaN layer with a thickness of 2.0μm as the unintentional Doped layer 12; lower the temperature to 1070°C, grow a Si-doped n-GaN layer with a thickness of 2.0 μm as the n-type doped layer 13, wherein the n-doped concentration is 5E+18atom / cm 3 ; lower...

Embodiment 2

[0076] The UV LED structure of the present embodiment and figure 2 Basically the same, the treatment of the substrate 10 in the specific preparation process, the low-temperature buffer layer 11, the unintentionally doped layer 12, the n-type doped layer 13, the quantum well transition layer 14, the p-type doped layer 16, and the metal contact layer 17 The growth method is consistent with that of Example 1, and will not be repeated here. Different from embodiment 1, the parameters in step 2) to step 6) are adjusted to some extent, as follows:

[0077] 2) Raise the temperature of the reaction chamber to 900°C, control the flow of TEGa to 250 sccm, the flow of TMAl to 100 sccm, NH 3 The flow rate is 50sl, and the first multi-quantum well unit barrier layer 15b1 with a thickness of 12nm is grown on the quantum well transition layer 14; the temperature is lowered to 820°C, and the flow rate of TEGa is controlled to 200 sccm, and the flow rate of TMIn to 120 sccm, NH 3 The flow r...

Embodiment 3

[0083] The UV LED structure of the present embodiment and figure 2 Basically the same, the specific preparation process differs from that of Example 2 in that: step 5) is omitted, only one second multi-quantum well unit is grown, and the rest of the steps are the same, and will not be repeated here.

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Abstract

The invention provides a preparation method of a UV LED and the UV LED. According to the preparation method of the UV LED provided by the invention, by controlling factors such as growth temperature of a first multi-quantum well structure and a second multi-quantum well structure, the flow of the introduced indium source, the growth position and the like, the limiting effect of the UV LED on electrons can be enhanced, the UV radiation efficiency is improved, meanwhile, the luminescence of visible light is increased; and therefore, the UV LED with adjustable main wavelength, adjustable lumen intensity, controllable inter-batch main wavelength lumen intensity and good uniformity can be prepared. The method can effectively omit the cost burden of increasing visible light indicating core particles during UV LED module design, and has the advantages of being easy and convenient to operate and easy to implement. The UV LED provided by the invention has the advantages of adjustable main wavelength, adjustable lumen intensity, controllable inter-batch main wavelength lumen intensity and good uniformity.

Description

technical field [0001] The invention belongs to the technical field of semiconductors, and relates to a method for preparing a UV LED and the UV LED. Background technique [0002] In recent years, UV LEDs (ultraviolet light-emitting diodes) have been widely used in electronics, precision parts, optical lenses, liquid crystal display panels, hard disks and other applications due to their long service life, no heat radiation, low calorific value, low energy consumption, and no pollution. Emerging fields are widely used. [0003] Each of the different UV wavelength types has its own specific application. Currently the most widely used is UVA (320-400nm), which has strong penetrating power, can penetrate most transparent glass and plastics, and can also penetrate the ozone layer and clouds to reach the dermis of the skin, destroying elastic fibers and Collagen fibers, which tan our skin, can be used in industrial fields such as industrial curing, PCB exposure, photocatalyst, a...

Claims

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Application Information

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IPC IPC(8): H01L33/00H01L33/06H01L33/08H01L33/32
CPCH01L33/0075H01L33/0066H01L33/06H01L33/325H01L33/08
Inventor 郑明兰郑远志康建陈向东
Owner MAANSHAN JASON SEMICON CO LTD