Regeneration processing method of substrate slice after SOI bonding process
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- MCL ELECTRONICS MATERIALS
- Publication Date
- 2021-07-30
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Abstract
Description
technical field
[0001] The invention belongs to the technical field of recovery and processing of integrated circuit monocrystalline silicon polished wafers, and in particular relates to a regeneration processing method of substrate wafers after an SOI bonding process. Background technique
[0002] Single crystal silicon polished wafer is a widely used semiconductor material, which can be used as a substrate for manufacturing SOI (Silicon-On-Insulator, silicon on insulating substrate) materials, SOI is a functional integrated circuit substrate It is a material in which a single crystal silicon film is grown on an insulating substrate, or a single crystal silicon film is separated from a silicon substrate by an insulating layer. It is an ideal material for manufacturing MOS transistors. With the development of ultra-large-scale integrated circuits, in order to reduce the cost of chip manufacturing, domestically mainly use polished single crystal silicon wafers with a diameter...