Light emitting diode with nitrogen polar surface n-type electron blocking layer

A technology of electron blocking layer and light-emitting diode, which is applied in the direction of circuits, electrical components, semiconductor devices, etc., can solve the problems of radiation recombination efficiency and luminous efficiency reduction, reduction of carrier radiation recombination efficiency, heterojunction interface energy band bending, etc. , to achieve the effect of reducing the two-dimensional electron gas density, increasing the probability of radiative recombination, and increasing the effective potential barrier

Active Publication Date: 2021-08-13
SOUTHEAST UNIV
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, these electron blocking layers still cannot satisfactorily solve the following technical problems: 1) The traditional p-type electron blocking layer also reduces the hole injection efficiency while blocking electron leakage, resulting in the radiative recombination efficiency of carriers in the LED 2) The lattice mismatch between the multi-quantum well active region and the electron blocking layer is generally large, resulting in a strong polarization electric field in the active region, causing the energy band

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Light emitting diode with nitrogen polar surface n-type electron blocking layer
  • Light emitting diode with nitrogen polar surface n-type electron blocking layer

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] The present invention will be further explained below in conjunction with the accompanying drawings.

[0022] Such as figure 1 As shown, a light-emitting diode with an n-type electron blocking layer on a nitrogen polar surface includes a substrate 101, a nitrogen polar surface nitride layer 102, a polarity inversion nitride layer 103, and an n-type electron blocking layer arranged sequentially from bottom to top. Type nitride ohmic contact layer 104, n-type nitrogen polar surface electron blocking layer 106, non-doped superlattice structure nitride layer 107, multiple quantum well active layer 108, p-type nitride ohmic contact layer 109, and n The n-type electrode 105 is provided on the ohmic contact layer 104 of nitride-type nitride, and the p-type electrode 110 is provided on the ohmic-contact layer 109 of p-type nitride.

[0023] Wherein, the nitride layer 102 on the nitrogen polar surface is GaN or AlN material with uniform composition. The polarity-reversed nitr...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
Thicknessaaaaaaaaaa
Thicknessaaaaaaaaaa
Thicknessaaaaaaaaaa
Login to view more

Abstract

The invention discloses a light emitting diode with a nitrogen polar surface n-type electron barrier layer. The light emitting diode comprises a substrate, a nitrogen polar nitride layer, a polarity reversal nitride layer, an n-type nitride ohmic contact layer, the n-type nitrogen polar surface electron barrier layer, a non-doped superlattice structure layer, a multi-quantum well active layer and a p-type nitride ohmic contact layer distributed from bottom to top in sequence; and an n-type electrode and a p-type electrode are respectively arranged on the n-type nitride ohmic contact layer and the p-type nitride ohmic contact layer. The nitrogen polar surface n-type electron blocking layer can limit spatially the number of electrons entering an active region; and since a traditional p-type doped electron barrier layer is removed, the injection rate of the holes can be increased, the number of the holes and the number of the electrons injected into the active region are kept at a balanced level, and the probability of electron and hole radiation recombination luminescence in the active region can be improved, so that the performance of the light emitting diode is improved.

Description

technical field [0001] The invention provides a light-emitting diode (LED) with a nitrogen polar surface n-type electron blocking layer, which belongs to the technical field of semiconductor optoelectronic materials and device manufacturing. Background technique [0002] Because LED has the advantages of high efficiency, energy saving, high reliability, and long life, and has great advantages compared with traditional lighting sources in terms of energy saving, emission reduction, and environmental protection, it has gradually replaced traditional lighting methods such as fluorescent lamps and incandescent lamps. . However, studies have shown that if figure 2 As shown, under the condition of high current injection, the internal quantum efficiency of LED decreases rapidly, and electrons can easily overcome the limitation of quantum wells to reach the p region and carry out non-radiative recombination with holes, which is one of the factors that lead to the decrease of LED lu...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): H01L33/16H01L33/14H01L33/06H01L33/32
CPCH01L33/16H01L33/145H01L33/06H01L33/32
Inventor 张雄徐珅禹胡国华崔一平
Owner SOUTHEAST UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products