LED epitaxial wafer manufacturing method suitable for small-spacing display screen
An LED epitaxial wafer and manufacturing method technology, applied in electrical components, electric solid devices, circuits, etc., can solve problems such as the inability to meet the needs of small-pitch display applications, the shift of LED light-emitting wavelengths, and the rise of the ground state of quantum wells. Tucker effect, reduced wavelength blue shift, increased luminous intensity
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Embodiment 1
[0048] This embodiment adopts the LED epitaxial wafer manufacturing method suitable for small-pitch display screens provided by the present invention, adopts MOCVD to grow GaN-based LED epitaxial wafers, and uses high-purity H 2 or high purity N 2 or high purity H 2 and high purity N 2 The mixed gas as the carrier gas, high-purity NH 3 As the N source, the metal-organic source trimethylgallium (TMGa) is used as the gallium source, trimethylindium (TMIn) is used as the indium source, and the N-type dopant is silane (SiH 4 ), trimethylaluminum (TMAl) as the aluminum source, and the P-type dopant as magnesium dicene (CP 2 Mg), the reaction pressure is between 70mbar and 600mbar. The specific growth method is as follows (for the epitaxial structure, please refer to figure 1 ):
[0049] The method for manufacturing LED epitaxial wafers suitable for small-pitch display screens includes: processing a sapphire substrate 1, growing a low-temperature GaN buffer layer 2, growing a ...
Embodiment 2
[0083] Comparative examples are provided below, that is, the growth method of the traditional LED epitaxial structure (for the epitaxial structure, please refer to figure 2 ).
[0084] Step 1: At a temperature of 1000-1100°C and a reaction chamber pressure of 100-300mbar, feed 100-130L / min of H 2 Under the conditions, process the sapphire substrate for 5-10 minutes.
[0085] Step 2: growing a low-temperature GaN buffer layer 2 and forming irregular small islands in the low-temperature GaN buffer layer 2 .
[0086] Specifically, the step 2 is further as follows:
[0087] At a temperature of 500-600°C and a reaction chamber pressure of 300-600mbar, 10000-20000sccm of NH is introduced 3 , 50-100sccm TMGa, 100-130L / min H 2 Under the condition of , growing the low-temperature GaN buffer layer 2 on the sapphire substrate 1, the thickness of the low-temperature GaN buffer layer 2 is 20-40nm;
[0088] At a temperature of 1000-1100°C and a reaction chamber pressure of 300-600mbar...
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