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AlN ultraviolet light-emitting diode based on nano pattern insertion layer, and preparation method thereof

A light-emitting diode and nano-pattern technology, applied in the field of microelectronics, can solve the problems of limited number of effective carriers, luminous efficiency of AlN ultraviolet LED devices less than 10%, application limitations, etc., so as to improve the probability of light output and improve light extraction. Efficiency, the effect of enhancing internal quantum efficiency

Pending Publication Date: 2021-12-07
西安电子科技大学芜湖研究院
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] Fourth, AlN doping (especially P-type doping) is extremely difficult, that is, the number of effective carriers inside the LED is limited, which affects the probability of electron and hole recombination
[0008] Based on the superimposed influence of the above problems and other factors, the luminous efficiency of AlN ultraviolet LED devices is less than 10%, and the application is limited

Method used

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  • AlN ultraviolet light-emitting diode based on nano pattern insertion layer, and preparation method thereof
  • AlN ultraviolet light-emitting diode based on nano pattern insertion layer, and preparation method thereof
  • AlN ultraviolet light-emitting diode based on nano pattern insertion layer, and preparation method thereof

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Experimental program
Comparison scheme
Effect test

Embodiment 1

[0022] See figure 1 , figure 1 It is a schematic structural diagram of an AlN ultraviolet light-emitting diode based on a nano-pattern insertion layer provided by an embodiment of the present invention. The AlN ultraviolet light-emitting diode includes from bottom to top: a patterned sapphire substrate, an AlN nano-pattern insertion layer, an AlN re-growth layer, n-type AlN layer, Al x Ga 1-x N / Al y Ga 1-y N multi-quantum well layer, Al z Ga 1-z N electron blocking layer, p-type AlN layer, p-type GaN contact layer, p-type electrode and n-type electrode; the surface of the AlN nano pattern insertion layer is covered with Ag first reflective layer and Ag second reflective layer.

[0023] Optionally, the patterned sapphire substrate is a C-plane patterned sapphire substrate; the thickness of the AlN nano-pattern insertion layer is 2-15um.

[0024] Optionally, the Ag first reflective layer and the Ag second reflective layer are metal materials; the thickness of the Ag first...

Embodiment 2

[0034] See figure 2 , figure 2 It is a schematic flow chart of a method for preparing an AlN ultraviolet light-emitting diode based on a nano-pattern insertion layer provided by an embodiment of the present invention, and the method includes:

[0035] Step 1: Perform heating and nitriding treatment on the patterned sapphire substrate in a preset reaction chamber based on pretreatment parameters, wherein the pretreatment parameters include preheating treatment parameters and nitriding treatment parameters.

[0036] Optionally, the patterned sapphire substrate is a C-plane patterned sapphire substrate.

[0037] Optionally, the step 1 includes:

[0038] Step 1-1: cleaning the patterned sapphire substrate.

[0039] Step 1-2: Preheating the cleaned patterned sapphire substrate based on the preheating parameters, wherein the preheating parameters include the vacuum degree of the reaction chamber, the first hydrogen flow rate, the first pressure of the reaction chamber, the subs...

Embodiment 3

[0086] Step 1: Perform heating and nitriding treatment on the patterned sapphire substrate in a preset reaction chamber based on pretreatment parameters, wherein the pretreatment parameters include preheating treatment parameters and nitriding treatment parameters.

[0087] Step 2: Based on the first growth parameter, grow the AlN nano-pattern insertion layer on the patterned sapphire substrate after nitriding treatment, wherein the first growth parameter includes the AlN layer growth parameter, the first thermal annealing parameter and the etching parameter .

[0088] The first growth parameter is set by those skilled in the art according to business needs, and it can be understood that the present invention does not make specific limitations thereto.

[0089] Optionally, the step 2 includes:

[0090] Step 2-1: Based on the AlN layer growth parameters, grow an AlN layer on the patterned sapphire substrate after nitriding treatment, wherein the AlN layer growth parameters inc...

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Abstract

The invention discloses an AlN ultraviolet light emitting diode based on a nano pattern insertion layer, and a preparation method thereof. The AlN ultraviolet light emitting diode comprises a pattern sapphire substrate, an AlN nano pattern insertion layer, an AlN regrowth layer, an n-type AlN layer, an Al < x > Ga < 1-x > N / Al < y > Ga < 1-y > N multi-quantum well layer, an Al < z > Ga < 1-z > N electron barrier layer, a p-type AlN layer, a p-type GaN contact layer, a p-type electrode and an n-type electrode from bottom to top; and the surface of the AlN nano pattern insertion layer is covered with an Ag first reflective layer and an Ag second reflective layer. According to the invention, the problems of high dislocation density, low light extraction efficiency and low light output power in a heteroepitaxial AlGaN / AlN-based light emitting diode can be overcome, and the AlN ultraviolet light emitting diode with high performance is prepared.

Description

technical field [0001] The invention belongs to the technical field of microelectronics, and in particular relates to an AlN ultraviolet light-emitting diode based on a pattern insertion layer and a preparation method thereof. Background technique [0002] Ultraviolet light-emitting diode (Light Emitting Diode, LED) is one of the most widely used light-emitting devices today. For traditional ultraviolet light sources, such as mercury lamps, long-wavelength ultraviolet lamps, metal halide lamps, etc., they have many inherent and difficult to overcome Defects, such as: harmful substances, environmental pollution, low efficiency, high energy consumption, short life, single wavelength, etc. Therefore, international research on new ultraviolet light sources has also been pushed on the agenda, and has become the focus of various countries in the semiconductor field one of the hotspots. Since AlN is a direct bandgap ultra-broadband semiconductor material, AlGaN-based ultraviolet L...

Claims

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Application Information

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IPC IPC(8): H01L33/10H01L33/20H01L33/00B82Y40/00
CPCH01L33/10H01L33/20H01L33/007B82Y40/00Y02P70/50
Inventor 许晟瑞吴前龙贠博祥陶鸿昌许文强范晓萌张雅超张进成郝跃
Owner 西安电子科技大学芜湖研究院