Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Large-size ultra-pure vanadium sputtering target material for integrated circuit chip and preparation process thereof

A sputtering target material and a preparation process technology, which are applied in the field of large-sized ultra-high-purity vanadium sputtering target material and its preparation, and can solve the problem of difficult industrial production, small size of high-purity vanadium target material, and purity that cannot meet the requirements of electronic-grade products, etc. problem, to achieve the effect of consistent grain distribution

Pending Publication Date: 2022-05-06
亚芯半导体材料(江苏)有限公司 +1
View PDF3 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The size of the high-purity vanadium target is small, and its purity cannot meet the use of electronic-grade products, and smelting requires repeated operations, which is time-consuming, laborious and inefficient, and is difficult to use in industrial production

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Large-size ultra-pure vanadium sputtering target material for integrated circuit chip and preparation process thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0046] A method for preparing a large-scale ultra-high-purity vanadium sputtering target for an integrated circuit chip, comprising the following steps:

[0047] Step S1, reacting vanadium and fluorine gas under high temperature conditions to prepare crude vanadium pentafluoride;

[0048] In step S2, the crude vanadium pentafluoride is purified by vacuum distillation, adsorption and metal reduction to obtain high-purity vanadium pentafluoride;

[0049] Step S3, reducing high-purity vanadium pentafluoride into ultra-high-purity metal vanadium by chemical vapor deposition;

[0050] Step S4, depositing ultra-high-purity metal vanadium on the base material, and producing a large-scale ultra-high-purity vanadium sputtering target in one step.

[0051] Wherein, the fluorine gas (diluted with nitrogen gas) in step S1 is fluorine gas (diluted with nitrogen gas) with a purity of 99.999% or more, and the metal vanadium is vanadium powder with a purity of 99.95% or more.

[0052] Speci...

Embodiment 2

[0062] A method for preparing a large-scale ultra-high-purity vanadium sputtering target for an integrated circuit chip, comprising the following steps:

[0063] Step S1, reacting vanadium and fluorine gas under high temperature conditions to prepare crude vanadium pentafluoride;

[0064] In step S2, the crude vanadium pentafluoride is purified by vacuum distillation, adsorption and metal reduction to obtain high-purity vanadium pentafluoride;

[0065] Step S3, reducing high-purity vanadium pentafluoride into ultra-high-purity metal vanadium by chemical vapor deposition;

[0066] Step S4, depositing ultra-high-purity metal vanadium on the base material, and producing a large-scale ultra-high-purity vanadium sputtering target in one step.

[0067] Wherein, the fluorine gas (diluted with nitrogen gas) in step S1 is fluorine gas (diluted with nitrogen gas) with a purity of 99.999% or more, and the metal vanadium is vanadium powder with a purity of 99.95% or more.

[0068] Speci...

Embodiment 3

[0078] A method for preparing a large-scale ultra-high-purity vanadium sputtering target for an integrated circuit chip, comprising the following steps:

[0079] Step S1, reacting vanadium and fluorine gas under high temperature conditions to prepare crude vanadium pentafluoride;

[0080] In step S2, the crude vanadium pentafluoride is purified by vacuum distillation, adsorption and metal reduction to obtain high-purity vanadium pentafluoride;

[0081] Step S3, reducing high-purity vanadium pentafluoride into ultra-high-purity metal vanadium by chemical vapor deposition;

[0082] Step S4, depositing ultra-high-purity metal vanadium on the base material, and producing a large-scale ultra-high-purity vanadium sputtering target in one step.

[0083] Wherein, the fluorine gas (diluted with nitrogen gas) in step S1 is fluorine gas (diluted with nitrogen gas) with a purity of 99.999% or more, and the metal vanadium is vanadium powder with a purity of 99.95% or more.

[0084] Speci...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
Diameteraaaaaaaaaa
Thicknessaaaaaaaaaa
Login to View More

Abstract

The invention belongs to the technical field of refractory metal vanadium sputtering target materials, and particularly relates to a large-size ultra-high-purity vanadium sputtering target material for an integrated circuit chip and a preparation technology thereof.The preparation technology comprises the following steps that S1, vanadium reacts with fluorine gas under the high-temperature condition, and a crude product vanadium pentafluoride is prepared; s2, purifying the crude product vanadium pentafluoride through a vacuum distillation method, an adsorption method and a metal reduction method to obtain high-purity vanadium pentafluoride; s3, reducing the high-purity vanadium pentafluoride into ultra-high-purity metal vanadium by adopting a chemical vapor deposition method; and S4, ultra-pure metal vanadium is deposited on the base material, and the large-size ultra-pure vanadium sputtering target material is produced through a one-step method. According to the ultra-high-purity vanadium sputtering target material manufactured through the method, fluorine gas diluted by high-purity nitrogen, high-purity vanadium powder and hydrogen reduction gas serve as raw materials and are completed in one step in specially-made chemical vapor deposition (CVD) equipment, the reaction process is continuous gas phase reaction, the consistency in all directions and the consistency between batches of products are far superior to those of a traditional vanadium target material, and therefore the ultra-high-purity vanadium sputtering target material is obtained. The purity of the prepared vanadium target material reaches 99.9999%.

Description

technical field [0001] The invention belongs to the technical field of refractory metal vanadium sputtering targets, and in particular relates to a large-size ultra-high-purity vanadium sputtering target for integrated circuit chips and a preparation process thereof. Background technique [0002] Vanadium metal targets are widely used in electronics and semiconductor fields, such as integrated circuits, semiconductor chips and other applications. Pure gold is generally used as the surface conductive layer in the production of integrated circuits, but gold and silicon wafers are prone to generate AuSi low-melting point compounds, resulting in weak bonding between gold and silicon interfaces. Adhesive layer, pure nickel is commonly used as the adhesive layer, but diffusion will also form between the nickel layer and the gold conductive layer, so a barrier layer is needed to prevent the diffusion between the gold conductive layer and the nickel adhesive layer. The barrier laye...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): C23C16/14C23C14/34
CPCC23C16/14C23C14/3414
Inventor 徐从康马赛贺涛陈箫箫
Owner 亚芯半导体材料(江苏)有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products