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Capacitors with high energy storage density and low esr

a technology of energy storage density and capacitors, applied in the field of capacitors with high energy storage density and low esr, can solve the problems of reducing the efficiency of the production process, reducing so as to reduce the impact of performance or subsequent packaging process flow, and reduce the cost of production

Inactive Publication Date: 2011-12-22
SUNDEW TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

This approach results in capacitors with improved capacitance density, extended lifetime, and reduced ESR, enabling their integration into PCBs without altering existing fabrication techniques, thus addressing the limitations of current capacitor technologies.

Problems solved by technology

ALD, up to now, has been considered too slow a process to make the fifty-micron thick films generally associated with such applications.
Thus, to build up a fifty-micron film using this technique has been considered far too laborious and slow for commercial purposes.

Method used

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  • Capacitors with high energy storage density and low esr
  • Capacitors with high energy storage density and low esr
  • Capacitors with high energy storage density and low esr

Examples

Experimental program
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embodiment 450

[0063]While the capacitor layout described in reference to FIG. 6a is suitable for low ESR applications, further improvements are obtained by the implementation of thick overlaying films in contact with layer 406. This embodiment further reduces series resistance related to the non-contact fraction of the area 424. The embodiment 450 is illustrated in FIG. 6b. Film 458 is preferably formed over contact layer 406′ without ambient exposure to avoid surface oxidation of layer 406′. For example, layer 458 is formed by sputtering 0.5 μm to 1 μm of aluminum as known to those who are skilled in the art. While this technique achieves substantially higher contact area through fractional area 424′, it is not required to substantially penetrate into the deep high-capacitance area features such as 422′. In some embodiments, film 458 completely replaces foil 408 (FIG. 6a). In most common applications, relatively thin film 458 is implemented with or without a complementary non-oxidizing film at t...

embodiment 1000

[0078]An objective of this invention is to fabricate high-energy storage capacitors. Advantageously, capacitors that are suitable for high voltage are fabricated over aluminum foils with lower area enhancement foil. For example, 50 μm foils with an etched ×40 area enhancement can accommodate a 1.0 μm thick Al2O3 dielectric layer grown on both sides of the foil by ALD or combination of anodic-oxidation and ALD as described above. Derated at 50%, these dielectric films are suitable for the fabrication of 500V capacitors. Low ESR contact is established, for example, by implementing a 50 nm TiN contact layer deposited by ALD followed by 0.5 μm of copper deposited by a combination of 10 nm seed ALD layer and electroplating and by utilizing a commercially available 5.8 μm thick aluminum foil 208 (FIG. 2). Accordingly, capacitance per area is 0.56 μF / cm2. The thickness of the stack is ˜56 μm and the weight per area is 0.01 gram / cm2. A capacitor with 400 μF is formed by winding 1 cm wide st...

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Abstract

Electrostatic capacitors with high capacitance density and high-energy storage are implemented over conventional electrolytic capacitor anode substrates using highly conformal contact layers deposited by atomic layer deposition. Capacitor films that are suitable for energy storage, electrical and electronics circuits, and for integration onto PC boards endure long lifetime and high-temperature operation range.

Description

CROSS-REFERENCES TO RELATED APPLICATIONS[0001]This application is a Divisional of U.S. patent application Ser. No. 11 / 658,201 filed on Jan. 19, 2007, which is a National Stage of PCT Application No. PCT / US2005 / 025768 filed on Jul. 20, 2005, which PCT application claims the benefit of U.S. Provisional Application No. 60 / 590,748 filed Jul. 23, 2004. All of the above patent applications, provisional, PCT, and non-provisional, are hereby incorporated by reference to the same extent as though fully contained herein.BACKGROUND OF THE INVENTION[0002]1. Field of the Invention[0003]This invention relates to the area of electronic components and more specifically to apparatus and method for constructing capacitors with high capacitance and high-energy storage density as well as low equivalent series resistance.[0004]2. Description of Prior Art[0005]Capacitor devices have a host of applications in the electrical, electronics, and microelectronics arts. Many different useful implementations of ...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): H01G4/30H01G7/00H01G4/00
CPCH01G4/10H01G4/30Y10T29/43H01G9/055Y10T29/435H01G4/32H01G9/045
Inventor SNEH, ANATSNEH, OFER
Owner SUNDEW TECH
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