Method for forming grounding via hole between gallium nitride device and circuit
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- NO 55 INST CHINA ELECTRONIC SCI & TECHNOLOGYGROUP CO LTD
- Publication Date
- 2010-09-29
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
Technical field
[0001] The present invention relates to a method for forming grounding through holes in semiconductor devices and circuits, and in particular to a method for forming gallium nitride devices and grounding through holes in circuits on a silicon carbide substrate. Background technique
[0002] At present, the use of semiconductor solid-state devices in microwave systems can effectively reduce system volume and improve reliability. With the development of science and technology, various microwave application systems urgently need electronic devices suitable for high temperature, high frequency, high power, and radiation resistance. Electronic devices based on traditional semiconductors such as Si and GaAs have output power density, high temperature resistance and radiation resistance. All aspects are greatly restricted, so it is necessary to find new semiconductor materials to replace Si and GaAs. Gallium nitride (GaN) is a new wide band gap semiconductor material, w...