Light emitting diode chip structure and manufacturing method thereof

A light-emitting diode and chip structure technology, which is applied in the direction of electrical components, circuits, semiconductor devices, etc., can solve the problems of increased controllability, limited brightness improvement, long corrosion time, etc., to improve quality and luminous efficiency, reduce interface Reflection, reduce the effect of internal absorption

A light-emitting diode and chip structure technology, which is applied in the direction of electrical components, circuits, semiconductor devices, etc., can solve the problems of increased controllability, limited brightness improvement, long corrosion time, etc., to improve quality and luminous efficiency, reduce interface Reflection, reduce the effect of internal absorption

CN101582479AActive Publication Date: 2009-11-18EPILIGHT TECH

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  • Light emitting diode chip structure and manufacturing method thereof
  • Light emitting diode chip structure and manufacturing method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0040] Step 1: Make a metal layer on the sapphire by using an electron beam evaporation machine or sputtering, and the metal material is one of titanium and nickel;

[0041] Step 2: Use photoresist to form a layer of photoresist film on the sapphire substrate, the thickness of the film layer is 0.1-2um, use photolithography technology to pattern the photoresist on the substrate to form the desired pattern ; Such as cylinder, round platform, etc.

[0042] Step 3: Reflow the photoresist at low temperature with a rubber baking table, reflow the previous photoresist pattern into a convex hull or truncated cone structure, and reflow the incomplete peripheral graphics caused by the mask operation into a convex hull or truncated cone shape , to make up for the lack of consistency between the peripheral graphics and the central graphics after the mask, so that the graphics consistency on the entire substrate is greatly improved. Reflow conditions: the baking temperature is 100 ° C, an...

Embodiment 2

[0052] Step 1: Make a metal layer on the sapphire by using an electron beam evaporation machine or sputtering, and the metal material is one of aluminum and chromium;

[0053] Step 2: Use photoresist to form a layer of photoresist film on the sapphire substrate, the thickness of the film layer is 5um, and use photolithography technology to pattern the photoresist on the substrate to form the desired pattern;

[0054] Step 3: Reflow the photoresist at low temperature with a rubber baking table, reflow the previous photoresist pattern into a convex hull or truncated cone structure, and reflow the incomplete peripheral graphics caused by the mask operation into a convex hull or truncated cone shape , to make up for the lack of consistency between the peripheral graphics and the central graphics after the mask, so that the graphics consistency on the entire film is greatly improved. Reflow conditions: baking temperature is 50 ° C ~ 250 ° C, time is 10 ~ 60 minutes;

[0055] Step 4...

Embodiment 3

[0064] Step 1: Use photoresist to form a layer of photoresist film on the sapphire substrate, the thickness of the film layer is 0.1um~5um, use photolithography technology to pattern the photoresist on the substrate to form a periodic arrangement the pit;

[0065] Step 2: Evaporate a metal layer on the surface of the previous substrate by electron beam evaporation or sputtering, the metal is nickel or other metals, and the thickness is 0.1-0.5um;

[0066] Step 3: Clean the photoresist by wet cleaning or stripping;

[0067] Step 4: By using metal as a mask, the metal pattern is transferred to the substrate by dry etching.

[0068] Step 5: Clean the metal with wet cleaning, and the corrosion solution is sulfuric acid and nitric acid solution;

[0069] Step 6: Etching the substrate by a wet method, corroding the pattern after step 1) into a triangular pyramid shape, and the etching solution is a mixed solution of sulfuric acid, phosphoric acid, sulfuric acid and phosphoric acid...

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Abstract

The invention relates to a light emitting diode chip structure, comprising a sapphire substrate layer; wherein, the sapphire substrate layer is provided with triangular pyramid microstructures arranged periodically. The invention also relates to a manufacturing method of the light emitting diode chip structure, including the following steps: 1) a graph is transferred onto the sapphire substrate by applying dry etching technology; 2) the graph on the sapphire substrate is formed in periodically arranged triangular pyramid by applying wet etching. The invention can greatly reduce boundary reflection and internal absorption as periodically arranged high quality triangular pyramid microstructures are formed on the sapphire substrate; and crystal defect of the sapphire is greatly reduced after wet etching, thus high crystal quality epitaxial layer can be grown on the surface and the quality and luminous efficiency of the light emitting diode are greatly improved.

Description

technical field [0001] The invention relates to a light-emitting diode chip manufacturing process, in particular to a structure and a manufacturing method for improving chip light extraction efficiency by changing the substrate structure. Background technique [0002] Light-emitting diodes have the advantages of small size, high efficiency and long life, and are widely used in traffic indication, outdoor full-color display and other fields. In particular, the use of high-power light-emitting diodes may realize semiconductor solid-state lighting, causing a revolution in the history of human lighting, thus It has gradually become a research hotspot in the field of electronics. In order to obtain high-brightness LEDs, the key is to improve the internal quantum efficiency and external quantum efficiency of the device. At present, the light extraction efficiency of the chip is the main factor limiting the external quantum efficiency of the device. The main reason is The refractiv...

Claims

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Application Information

Patent Timeline
18 Nov 2009
Publication
CN101582479A
IPC
H01L33/00
Inventors
袁根如; 郝茂盛