CMOS (Complementary Metal-Oxide-Semiconductor Transistor)-process compatible grid-control p-n junction forward-direction injection type silicon light-emitting device and production method thereof
A technology for light-emitting devices and manufacturing methods, which are applied in semiconductor/solid-state device manufacturing, electric solid-state devices, semiconductor devices, etc., can solve the problems of common power supply, low luminous efficiency, and inability to control light intensity, and achieve low operating voltage, high The effect of luminous intensity
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[0054] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.
[0055] 1. Device structure and fabrication process
[0056] figure 1 A schematic diagram of the unit structure of a silicon light-emitting device in an N-well process on a P-type silicon substrate is given, and the emitter P is manufactured in the N-well 12 by ion implantation or diffusion according to a typical CMOS process flow + The doped region 110 and the N well electrically contact the N + Doping region 13, the body concentration is 8×10 18 cm -3 above. The P+ doped region 110 is completed simultaneously with the source and drain of the P-channel MOSFET; N + The doped region 13 is completed simultaneously with the source and drain of the N channel. Then, an ultra-thin gate oxide layer 18 with a thickness in the range of 3-7 nm is grown on the upper surface of the N well 12 by a thermal oxidation method (prepared simultaneously with the CMO...
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