Method for passivating back of crystal silicon solar cell
A solar cell and backside passivation technology, which is applied in the field of solar photovoltaic utilization, can solve the problems of poor long-wave response of the battery, unfavorable components, and bending of the battery sheet, and achieve the effects of reducing the recombination rate, reducing the bending, and enhancing the back reflection
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- Publication Date
- 2010-12-15
- Estimated Expiration
- Not applicable · inactive patent
Smart Images
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Abstract
Description
technical field
[0001] The invention relates to the technical field of photovoltaic utilization of solar energy, in particular to a preparation method of a crystalline silicon solar cell. Background technique
[0002] The current commercial solar cell production process is simple and the manufacturing cost is relatively low. Its production process: remove the damaged layer on the surface of the silicon wafer, make texture → in POCl 3 Diffusion of P in the atmosphere to form n + Diffusion layer → use plasma etching or wet etching to remove the PN junction around the silicon wafer → use PECVD technology to deposit SiNx anti-reflection film on the front → screen print the back electrode, back electric field, and positive electrode → form by sintering in a sintering furnace Ohmic contact → test sorting. This commercial solar cell manufacturing technology is relatively simple, low in cost, suitable for industrialized and automated production, and thus widely used. However, th...
Examples
Embodiment 1
[0023] figure 2 , 3 Shown is the specific preparation process of the embodiment of the present invention:
[0024] (1) making a suede surface after removing the surface damage layer of the silicon wafer 1;
[0025] (2) Diffusion of P in POCl3 atmosphere to form n + diffusion layer;
[0026] (3) Deposit SiNx antireflection film 2 on the front side of silicon wafer 1 with PECVD;
[0027] (4) Corroding the back side of the solar cell in 20% sodium hydroxide solution at 70° C. for 15 minutes to obtain a polished surface 5;
[0028] (5) Deposit SiO on the polished surface 5 2 / SiNx (passivation layer 61 / passivation layer 62) forms the back passivation layer 6;
[0029] (6) Utilize laser etching or screen printing corrosive paste to open an electrode window on the back passivation layer 6;
[0030] (7) screen printing back electrode and positive electrode;
[0031] (8) Sintering in a sintering furnace to form an ohmic contact;
[0032] (9) Test sorting.
Embodiment 2
[0034] figure 2 , 3 Shown is the specific preparation process of the embodiment of the present invention:
[0035] (1) making a suede surface after removing the surface damage layer of the silicon wafer 1;
[0036] (2) Diffusion of P in POCl3 atmosphere to form n + diffusion layer;
[0037] (3) Deposit SiNx antireflection film 2 on the front side of silicon wafer 1 with PECVD;
[0038] (4) Corroding the back side of the solar cell in 30% potassium hydroxide solution at 80° C. for 12 minutes to obtain a polished surface 5;
[0039] (5) Deposit SiC / SiNx (passivation layer 61 / passivation layer 62) on the polishing surface 5 to form a back passivation layer 6;
[0040] (6) Utilize laser etching or screen printing corrosive paste to open an electrode window on the back passivation layer 6;
[0041] (7) screen printing back electrode and positive electrode;
[0042] (8) Sintering in a sintering furnace to form an ohmic contact;
[0043] (9) Test sorting.
Embodiment 3
[0045] figure 2 , 3 Shown is the specific preparation process of the embodiment of the present invention:
[0046] (1) making a suede surface after removing the surface damage layer of the silicon wafer 1;
[0047] (2) Diffusion of P in POCl3 atmosphere to form n + diffusion layer;
[0048] (3) Deposit SiNx antireflection film 2 on the front side of silicon wafer 1 with PECVD;
[0049] (4) Corroding the back side of the solar cell for 10 minutes in a 20% tetramethylammonium hydroxide solution at 80° C. to obtain a polished surface 5;
[0050] (5) Deposit a-Si / SiO on the polished surface 5 2 (passivation layer 61 / passivation layer 62) forming a back passivation layer 6;
[0051] (6) Utilize laser etching or screen printing corrosive paste to open an electrode window on the back passivation layer 6;
[0052] (7) screen printing back electrode and positive electrode;
[0053] (8) Sintering in a sintering furnace to form an ohmic contact;
[0054] (9) Test sorting.