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Etching solution composition for metal thin film consisting primarily of copper

一种蚀刻液、组合物的技术,应用在蚀刻液组合物领域,能够解决易产生颗粒、需要劳动力、基板密合性恶化等问题,达到优异图案形状、高蚀刻活性、抑制蚀刻速度的效果

Inactive Publication Date: 2012-08-01
KANTO CHEM CO INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] However, the etching solution using these peroxides has the following problems: i) the etching solution becomes unstable due to the peroxide content, and it may be difficult to supply it as a single solution; ii) the influence of Cu ions eluted during etching , to promote the decomposition of peroxides, and the life of the etching solution is short; iii) The peroxides accumulated in dead ends or waste liquids have the danger of explosion; iv) dry etching is prone to produce particles, and the yield rate is reduced. fixtures are expensive
However, in the method described in the same document, in order to adjust the etching rate of silver alloy and molybdenum, it is necessary to flow the etchant to meet appropriate conditions, and labor is required to adjust the conditions, and the etching rate under the flow condition of mixed acid is largely dependent on silver. material properties of alloys and molybdenum, so the method cannot be directly applied to other metal systems
[0012] In particular, an etchant combination for simultaneously etching a single film made of copper or a copper alloy and a multilayer film including two or more layers of the metal with an etchant composition containing phosphoric acid, nitric acid, and acetic acid has been reported. material and etching method (Patent Document 7), the layer as a "copper alloy" in the same document only discloses copper (I) oxide (CuO), and there is no specific description of alloys of copper and other metals in essence. , the same document does not describe the control of the taper angle, which is a very important element in microfabrication.
[0013] Furthermore, the film of copper (I) oxide (CuO) has a problem that the adhesion to the substrate is deteriorated because the oxide film is reduced due to the hydrogen plasma treatment performed in the TFT manufacturing process in the flat panel display manufacturing process.
For laminated films with copper and copper alloys, copper alloys are Cu-Mo, Cu-Ti, Cu-Ca, Cu-Mg, Cu-Ca-O, Cu-Mg-O, Cu-Al, Cu -Zr, Cu-Mn, Cu-NiB, Cu-Mn-B, Cu-Ni-B, Cu-Si, Cu-Al, Cu-Mo, Cu-Al, Cu-Mg-B, Cu-Ti-B , Cu-Mo-B, Cu-Al-B, Cu-Si-B, Cu-Mg-Al, Cu-Mg-Al-O and other laminated films, and further layers with copper and copper oxide (CuO) A large number of laminated films such as laminated films are candidates for next-generation films, but practically satisfactory films have not yet been achieved, and it is expected that the technology for fine pattern processing will be established soon

Method used

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  • Etching solution composition for metal thin film consisting primarily of copper
  • Etching solution composition for metal thin film consisting primarily of copper
  • Etching solution composition for metal thin film consisting primarily of copper

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1~2

[0079] Thick film formed on glass substrate Cu alloy (Cu-Mg-Al), film thickness After forming a Cu film, a resist pattern was formed and immersed in the etching solution in Table 1 (Examples 1-2) at a liquid temperature of 30° C. for 1.5 times the appropriate etching time. Thereafter, the washed and dried substrate was observed under a microscope, and the amount of side etching, tapered shape, and residue after etching were evaluated.

[0080] The results are shown in Table 1.

[0081] Table 1

[0082] Cu / CuMgAl / Glass substrate

[0083]

Embodiment 3~4

[0085] Thick film formed on glass substrate Cu alloy (Cu-Mg-Al-O), film thickness After forming a Cu film, a resist pattern was formed and immersed in the etching solution in Table 2 (Examples 3-4) at a liquid temperature of 30°C for 1.5 times the appropriate etching time. Thereafter, the washed and dried substrate was observed under a microscope, and the amount of side etching, tapered shape, and residue after etching were evaluated.

[0086] The results are shown in Table 2.

[0087] Table 2

[0088] Cu / CuMgAlO / glass substrate

[0089]

[0090] The etchant composition of the present invention has a specific composition due to phosphoric acid, nitric acid, and acetic acid, so that a metal laminate film formed of copper / copper alloy or copper alloy / copper / copper alloy can be formed with almost no etching residue and good precision. Etching process can be performed accurately to obtain an excellent pattern shape, and a flat panel display device with high yield a...

Embodiment 5~8

[0092] Thick film formed on glass substrate After the Cu alloy film (Cu-Mg-Al), the film thickness is formed After the Cu film was formed, the substrate with the resist pattern and the glass substrate were formed with a film thickness Cu alloy oxide film (Cu-Mg-Al-O), followed by the formation of film thickness Cu alloy film (Cu-Mg-Al), forming a film thickness After forming the film of Cu, a resist pattern is formed. For the etching solution in Table 1 (Example 1), the stirrer is stirred under the condition of no stirring or the condition of the number of revolutions of 700rpm. 1.5 times the time of immersion. Thereafter, the washed and dried substrate was observed under a microscope, and the amount of side etching, tapered shape, and residue after etching were evaluated. The results are shown in Table 3.

[0093] table 3

[0094] Cu / CuMgAl / glass substrate, Cu / CuMgAl / CuMgAlO / glass substrate

[0095]

Substrate

to stir

Side etching amount

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Abstract

The problem of the present invention is to provide an etching solution composition that can etch with high accuracy a metal-laminated film pattern comprising thin films of copper and a copper alloy, can form an excellent pattern shape, and has practically excellent and stable characteristics with long solution life, and to provide an etching method using such etching solution composition. The present invention relates to an etching method for etching a metal-laminated film having a layer consisting of copper and a layer consisting of a copper alloy containing copper, using an etching solution composition comprising phosphoric acid, nitric acid, acetic acid and water, as well as to said etching solution composition.

Description

technical field [0001] The present invention relates to an etching solution composition for etching a metal laminated film of copper and a copper alloy containing copper as a main component used in the manufacture of flat panel displays and the like, and an etching method using the etching solution composition. Background technique [0002] Aluminum thin films have conventionally been used as fine wiring materials for liquid crystal display devices, but in recent years, copper thin films having lower resistance characteristics than aluminum have attracted attention (see Patent Documents 1 and 2). [0003] In the past, copper has been used as a metal material for forming patterns for printed circuit boards, but as drive transistor electrodes and fine patterns of flat panel displays, in order to form patterns with a line width of several microns or less, copper and copper-based components have not been used so far. copper alloy. Therefore, the copper thin film etching technol...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): C23F1/18
CPCC23F1/18A47J37/041A47J37/0786A47J37/067
Inventor 大城研二河野良高桥秀树
Owner KANTO CHEM CO INC
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