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Method for preparing nitrogen oxygen silicon thin film

A silicon oxynitride and thin film technology, which is used in semiconductor/solid-state device manufacturing, gaseous chemical plating, coating, etc., can solve the problems of high deposition temperature and difficult control of various indicators of thin films.

Inactive Publication Date: 2015-12-16
PIOTECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to solve the above problems, and mainly solve the problems that the prior art uses thermal oxidation and chemical methods for vapor phase deposition, and there are problems that the deposition temperature is high and the various indicators of the film are not easy to control

Method used

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  • Method for preparing nitrogen oxygen silicon thin film
  • Method for preparing nitrogen oxygen silicon thin film
  • Method for preparing nitrogen oxygen silicon thin film

Examples

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Comparison scheme
Effect test

no. 1 example

[0027] The first example of the present invention prepares the method for silicon oxynitride thin film, concrete steps are as follows:

[0028] 1) Deposition chamber stage such as figure 1 The stage 2 in the middle reaction chamber, that is, the temperature of the heating plate is 400°C,

[0029] Its control method is to monitor and control the temperature in real time through thermocouples

[0030] 2) Put the wafer 3 on the stage 2 of the reaction chamber, pass the gas silane, laughing gas, helium and nitrogen into the reaction chamber through the upper electrode shower head 1, and the gas flow rate is 300 sccm for silane; 1100sccm; 5000sccm for helium; 900sccm for nitrogen.

[0031] 3) While the chamber is being ventilated, set the reaction chamber pressure to 3.5 torr, which is the reaction pressure during the deposition process;

[0032] 4) On the basis of the ventilation step, the radio frequency is provided by the radio frequency system to start the film deposition pr...

Embodiment approach 2

[0038] The second example of the present invention prepares the method for silicon oxynitride thin film, concrete steps are as follows:

[0039] 1) Deposition chamber stage such as figure 1 The stage 2 in the middle reaction chamber, that is, the temperature of the heating plate is 400°C, and its

[0040] The control method is to monitor and control the temperature in real time through thermocouples

[0041] 2) Put the wafer 3 on the stage 2 of the reaction chamber, pass the gas silane, nitrous oxide, helium and nitrogen into the reaction chamber through the upper electrode shower head 1, and change the flow ratio of silane and nitrous oxide, 270 / 900, 285 / 1000, 300 / 1100, 315 / 1200 and 330 / 1300 sccm.

[0042] 3) While the chamber is being ventilated, set the reaction chamber pressure to 3.5 torr, which is the reaction pressure during the deposition process;

[0043] 4) On the basis of the aeration step, the radio frequency is provided by the radio frequency system, and the r...

Embodiment 2

[0047] Example 2 shows that by changing the flow ratio of the reaction gas silane and laughing gas, the deposition rate can also be changed, and at the same time the optical constants of the film can be changed to realize different applications of the film in semiconductor integrated circuits.

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Abstract

A method for preparing nitrogen oxygen silicon thin films mainly solves the problems that in the prior art, a thermal oxidation and chemical method is used for carrying out vapor deposition, and consequently, the deposition temperature is high, and various indexes of the thin films are not prone to being controlled. The method comprises the implementation steps of firstly, carrying table temperature control, wherein a bottom electrode precisely controls the temperature through a thermocouple; secondly, sample loading, wherein a substrate is conveyed into a reaction cavity through an automatic piece conveying system; thirdly, gas leading, wherein, the gas is led into a top electrode, that is a spraying head, in the reaction cavity; fourthly, deposition, wherein a radio frequency is provided by a radio frequency system, and the thin films are deposited through a plasma technology; fifthly, aftertreatment, wherein main reaction source silane is stopped from being led in, and the radio frequency is used for carrying out aftertreatment on the surfaces of the thin films; and sixthly, vacuum pumping, wherein the technology is stopped. Reaction gas enters a reaction cavity through a spraying head after being mixed, and the radio frequency power is led into the reaction cavity for deposition, and the high-compactness thin films can be obtained. Deposition of the thin films at different temperatures can be achieved, and the nitrogen oxygen silicon thin films with different properties, different film thicknesses, different refractive indexes and different extinction coefficients can be obtained through changing of reaction parameters. The method can be widely applied to the technical field of manufacturing and applying of semiconductor thin films.

Description

technical field [0001] The invention relates to a method for preparing a silicon oxynitride film, specifically a method for depositing a silicon oxynitride film by using plasma chemical vapor deposition equipment, and belongs to the technical field of semiconductor film manufacture and application. Background technique [0002] In semiconductor integrated circuits, insulating dielectric films are used as inter-metal dielectric layers, passivation layers or anti-reflection layers, and play a very important role in the semiconductor manufacturing process. Silicon oxynitride film is a new type of film material with good optical properties, and it is mostly used in the anti-reflection layer of semiconductor integrated circuits. The traditional method of depositing silicon oxynitride film uses thermal oxidation and chemical vapor deposition, the deposition temperature is high, and the various indicators of the film are not easy to control. [0003] At present, with the continuou...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): C23C16/30C23C16/44H01L21/02
Inventor 曹晓杰刘忆军
Owner PIOTECH CO LTD