Method for determining ZSM-23 molecular sieve relative crystallinity

A ZSM-23, relative crystallinity technology, used in the preparation of test samples, material analysis using radiation diffraction, etc., to achieve the effect of reliable technical support

Active Publication Date: 2016-11-30
PETROCHINA CO LTD
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Problems solved by technology

All ZSM-23 molecular sieve preparation patents usually only list the XRD of the instrument used or the comparison between its XRD spectru

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  • Method for determining ZSM-23 molecular sieve relative crystallinity
  • Method for determining ZSM-23 molecular sieve relative crystallinity
  • Method for determining ZSM-23 molecular sieve relative crystallinity

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Embodiment Construction

[0049] The embodiments of the present invention are described in detail below: the present embodiment is implemented under the premise of the technical solution of the present invention, and detailed implementation methods and processes are provided, but the protection scope of the present invention is not limited to the following embodiments, the following The experimental method that does not indicate specific condition in the embodiment, generally according to routine condition.

[0050] The signal-to-noise ratio of the weakest diffraction peak diffraction signal in the X-ray diffraction spectrum of the industrial sample to be measured:

[0051] In the present invention, the signal-to-noise ratio of the weakest diffraction peak diffraction signal in the X-ray diffraction spectrum of the industrial sample to be measured is not particularly limited. Signal-to-noise ratio S / N>10, determine the parameters of powder X-ray diffractometer voltage, current, divergence slit, diver...

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Abstract

A method for measuring the relative crystallinity of ZSM-23 molecular sieves, comprising the following steps: a, pretreatment of samples: grinding, sieving, roasting and activating ZSM-23 molecular sieve standard samples and industrial samples to be tested, and controlling temperature and humidity to absorb water Four steps to prepare the standard sample to be tested and the industrial sample to be tested; b. Determination of the working conditions of the powder X-ray diffractometer; c. Measurement: measure and collect the powder X-ray diffraction data; d. Calculation: use powder X-ray diffraction The chemometric peak division method of the diffraction data processing system software measures the 8 crystal planes of the sample (111), (121), (042), (003), (112), (060), (122), (052) The peak area integration intensity count values ​​of the diffraction peaks are summed, and the relative crystallinity of the industrial sample to be tested is calculated by the external standard method.

Description

technical field [0001] The patent of the present invention relates to a powder X-ray diffraction method for determining the crystallinity of molecular sieves, specifically a powder X-ray diffraction method for determining the relative crystallinity of an industrial product ZSM-23 molecular sieve. Background technique [0002] Zeolite molecular sieves are widely used as catalysts or catalyst supports in the catalytic process of petrochemical industry. Relative crystallinity, unit cell parameters, silicon-aluminum ratio, purity, etc. are indispensable basic parameters to characterize the performance of molecular sieves. Therefore, it is very important to accurately determine the crystallinity of molecular sieves for designing molecular sieve preparation processes and evaluating the performance of related catalysts. The powder X-ray diffraction method has the advantages of simple sample preparation, short measurement time, good repeatability, high reliability and low cost, and...

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Application Information

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IPC IPC(8): G01N23/20G01N1/28
Inventor 李瑞峰王磊
Owner PETROCHINA CO LTD
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