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Photoetching method of graphical sapphire substrate

A technology for patterning sapphire and substrates, which is applied in microlithography exposure equipment, photolithography process of pattern surface, optics, etc., can solve the problems of poor pattern consistency, low product qualification rate, and high linear dislocation density, and achieves The effect of high finished product qualification rate and yield, accurate pattern size and low linear dislocation density

Pending Publication Date: 2017-04-26
福建中晶科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the existing photolithography methods for patterning sapphire substrates in China often have problems such as high linear dislocation density, low internal quantum density, low resolution, low productivity, poor pattern consistency, and low product qualification rate.

Method used

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  • Photoetching method of graphical sapphire substrate
  • Photoetching method of graphical sapphire substrate
  • Photoetching method of graphical sapphire substrate

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0020] A kind of photolithography method of patterned sapphire substrate that the present invention proposes, comprises the following steps:

[0021] S1. Using plasma-enhanced chemical vapor deposition technology to deposit a layer of SiO on a patterned sapphire substrate 2 film, and use high-pressure nitrogen blowing method to remove the particles on the surface of the film, and perform low-temperature drying treatment;

[0022] S2. When the rotation speed is 5000RPM and the rotation acceleration is constant, drop liquid photoresist and tackifier into the middle of the substrate film layer at a mass ratio of 1:0.05, and use centrifugal force to place the liquid photoresist Evenly cover the surface of the wafer, and then put the substrate with photoresist on the hot plate for baking, the baking temperature is 100°C, and the baking time is 40s to form a photoresist film with a thickness of 1 μm;

[0023] S3. Keep the distance between the mask plate and the substrate at 3cm, pr...

Embodiment 2

[0026] A kind of photolithography method of patterned sapphire substrate that the present invention proposes, comprises the following steps:

[0027] S1. Using plasma-enhanced chemical vapor deposition technology to deposit a layer of Si on a patterned sapphire substrate 3 N 4 film, and use chemical wet cleaning method to remove the particles on the surface of the film, and perform low-temperature drying treatment;

[0028] S2. When the rotation speed is 3000RPM and the rotation acceleration is constant, drop liquid photoresist and tackifier into the middle of the substrate film layer at a mass ratio of 1:0.02, and use centrifugal force to place the liquid photoresist Evenly cover the surface of the wafer, and then put the substrate with photoresist on the hot plate for baking, the baking temperature is 90°C, and the baking time is 60s to form a photoresist film with a thickness of 0.8 μm;

[0029] S3. Keep the distance between the mask plate and the substrate at 2.5cm, proj...

Embodiment 3

[0032] A kind of photolithography method of patterned sapphire substrate that the present invention proposes, comprises the following steps:

[0033] S1. Using plasma-enhanced chemical vapor deposition technology, a layer of Ni film is deposited on a patterned sapphire substrate, and the particles on the surface of the film are removed by high-pressure nitrogen blowing method, and low-temperature drying is performed;

[0034] S2. When the rotation speed is 6000RPM and the rotation acceleration is constant, drop liquid photoresist and tackifier into the middle of the substrate film layer at a mass ratio of 1:0.06, and use centrifugal force to place the liquid photoresist Evenly cover the surface of the wafer, and then put the substrate with photoresist on the hot plate for baking, the baking temperature is 80°C, and the baking time is 90s, forming a photoresist film with a thickness of 1.2 μm;

[0035] S3. Keep the distance between the mask plate and the substrate at 4cm, proje...

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Abstract

The invention discloses a photoetching method of a graphical sapphire substrate. The method comprises the following steps: depositing a film on the graphical sapphire substrate, and performing particle removing and low-temperature drying processing on the film; under the condition that a rotation accelerated speed is not changed, adding a liquid-state photoresist and an adhesion agent in the middle of a substrate film surface drop by drop, uniformly covering the surface of a wafer with the liquid photoresist, and performing baking so as to form a photoresist membrane; projecting a graphic file on a mask on the substrate photoresist membrane, setting an exposure condition, and performing exposure processing; and under the condition that the rotation accelerated speed is not changed, spraying a developing solvent on the surface of the substrate photoresist membrane to perform development processing, and after the development is completed, performing development examination. According to the invention, the method has the following advantages: the exposure precision grade is high, the technical repeatability is good, the line dislocation density is low, the inner quantum density is high, the resolution is high, the finished product qualified rate and the yield are high, the graphical dimension of an obtained finished product is accurate, the integrity is good, the performance is stable, and the application prospect is wide.

Description

technical field [0001] The invention relates to the technical field of semiconductor manufacturing, in particular to a photolithographic method for patterning a sapphire substrate. Background technique [0002] Photolithography is the process of removing specific parts of the film on the wafer surface through a series of production steps. After this, a film with a micropatterned structure remains on the wafer surface. Through the photolithography process, what is finally reserved on the wafer is the characteristic pattern part. The photolithography process uses the combination of photocopying and chemical etching to produce precise, fine and complex thin-layer patterns on the surface of the workpiece. Although the principle of photolithography was known in the early 19th century, it has not been applied for a long time due to the lack of good photoresists. It was not until the 1950s that Kodak photoresist (KPR) with high resolution and excellent corrosion resistance was m...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/027G03F7/20
CPCG03F7/2022G03F7/70733H01L21/027
Inventor 仇凯弘
Owner 福建中晶科技有限公司
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