Method for determining impurity elements in high-purity aluminum through microwave digestion-inductive coupled plasma optical emission spectrometer
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A technology of microwave digestion and plasma, which is applied in thermal excitation analysis, material excitation analysis, preparation of test samples, etc., can solve the problems of long time consumption and easy pollution of acid wet digestion, and achieve fast measurement speed and accuracy High, high detection authenticity effect
Inactive Publication Date: 2018-08-07
BEIJING UNIV OF TECH
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[0003] Due to the high purity of high-purity aluminum, the content of other elements is very low, generally at trace or trace levels. The current digestion method for high-purity aluminum is wet digestion with acid. High, when dissolving high-purity aluminum samples, acid wet digestion takes a long time and is prone to contamination
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Embodiment 1
[0048] Experimental steps:
[0049] 1. Clean the sample
[0050] Rinse with deionized water and dry for use.
[0051] 2. Sample dissolution
[0052]Weigh 5g of high-purity aluminum sample (accurate to ±0.0001g) into a 100mL polytetrafluoroethylene digestion tank, add 5mL of hydrochloric acid and 1mL of nitric acid, cover it and place it in a microwave digestion apparatus for digestion. After the digestion program (see Table 1) is finished, take it out, open the can after cooling down, dilute it in a 100mL volumetric flask with deionized water, and shake it well for testing. Make a blank along with the sample.
[0053] 3. Instrument operation
[0054] Open the analysis control software, preheat the instrument for half an hour, set the equipment power to 1.0Kw, the cooling air flow rate to 15L / min, the auxiliary air flow rate to 0.2L / min, the atomization pressure to 50psi (1psi=6.89kPa), and the sample lifting speed to 1.2 ml / min, click the "Plasma" button to form a stable ...
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Abstract
The invention provides a method for determining impurity elements in high-purity aluminum through a microwave digestion-inductively coupled plasma emission spectrometer and belongs to the technical field of analysis and test. The invention provides an analysis method for determining 20 impurity elements including Ag, Ba, Bi, Cd, Co, Cu, Ga, Fe, In, Li, Mg, Mn, Mo, Pb, Sb, Ti, V, Sr, Zn and Zr in the high-purity aluminum through a microwave digester and an inductive coupled plasma optical emission spectrometer (ICP-OES) by adopting a standard curve method. A sample is dissolved into a sealed high-pressure microwave digestion tank by utilizing a proper amount acid, so as to avoid external factor pollution better. Optimal working parameters of an instrument are determined through a single-factor experiment. A standard curve-method test sample is selected so that matrix interference is reduced. The method is a simple, rapid and accurate modern detection technology capable of determining 20elements in one step.
Description
technical field [0001] The invention belongs to the technical field of analysis and testing, and relates to the determination of Ag, Ba, Bi, Cd, Co, Cu, Ga, Analysis method of 20 impurity elements including Fe, In, Li, Mg, Mn, Mo, Pb, Sb, Ti, V, Sr, Zn, Zr. Background technique [0002] High-purity aluminum has many excellent properties, including low deformation resistance, high electrical conductivity and good plasticity, etc. It is mainly used in scientific research, electronics industry, chemical industry and the manufacture of high-purity alloys, laser materials, aerospace and some other special purposes. The quality of high-purity aluminum directly affects its performance during use. Therefore, it is of great significance to quickly and efficiently detect the impurity content in high-purity aluminum. [0003] Due to the high purity of high-purity aluminum, the content of other elements is very low, generally at trace or trace levels. The current digestion method for ...
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