A method for preparing dense tin oxide thin film by ultrasonic oscillation at room temperature
A technology of ultrasonic oscillation and tin oxide, applied in the coating and other directions, can solve the problems of thermal deformation of PET and other polymer substrates, and achieve the effect of uniform and dense electrical conductivity, excellent electrical conductivity and energy saving.
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Embodiment 1
[0043](1) Add 1.128g of stannous chloride dihydrate (purchased from Sigma-Aldrich) into 50ml of anhydrous isopropanol (purchased from Sinopharm) solution to prepare a 1M tin oxide precursor solution, at 70°C Reflux for 1 hour to obtain a tin oxide sol, and leave the tin oxide sol at room temperature to age for 8 hours to obtain a stable tin oxide sol;
[0044] (2) The PET sputtered with ITO (purchased from South China Xiangcheng Technology Co., Ltd.) was ultrasonically cleaned with glass cleaner, acetone, and ethanol for 20 minutes, and then dried in a 70°C oven for 45 minutes; on the pretreated conductive substrate Spin-coat the above-mentioned 1M tin oxide sol at 3000 rpm to obtain a tin oxide sol film;
[0045] (3) The tin oxide sol thin film was ultrasonically oscillated at room temperature for 3 min at 10 W to obtain a uniform and dense tin oxide thin film.
[0046] The obtained tin oxide thin film of present embodiment is observed by scanning electron microscope, and th...
Embodiment 2
[0050] The preparation process is the same as steps (1) and (2) in Example 1 to obtain a tin oxide sol film. The prepared sol film was ultrasonically oscillated at 10 W for 2 min to obtain a tin oxide film.
[0051] The tin oxide film obtained in the present embodiment is observed by X-ray diffractometer, and the results are as follows: Figure 5 As shown, a crystallized tin oxide film is obtained, and the diffraction peak corresponding to the (101) crystal plane at the 2θ angle of 37.7° is weaker than that of the sample shaken at 10W for 3 minutes.
[0052] The tin oxide thin film obtained in the present embodiment obtains the I-V curve of thin film by Keithley source meter, and the result is as follows Image 6 As shown, according to the formula: conductivity = film thickness / (area · slope), the area and film thickness are fixed at 16mm 2 and 30nm, the slope value in the figure is 72.37, according to the formula calculation, the conductivity of the tin oxide film is 0.13...
Embodiment 3
[0054] The preparation process is the same as steps (1) and (2) in Example 1 to obtain a tin oxide sol film. The prepared sol film was ultrasonically oscillated at 15W for 1 min to obtain a tin oxide film.
[0055] The tin oxide film obtained in the present embodiment is observed by X-ray diffractometer, and the results are as follows: Figure 7 As shown, the crystallized tin oxide film was obtained, and the diffraction peak corresponding to the (101) crystal plane at the 2θ angle of 37.7° was slightly weaker than that of the sample shaken at 10W for 3 minutes, and stronger than that of the sample shaken at 10W for 2 minutes.
[0056] The tin oxide thin film obtained in the present embodiment obtains the I-V curve of thin film by Keithley source meter, and the result is as follows Figure 8 As shown, according to the formula: conductivity = film thickness / (area · slope), the area and film thickness are fixed at 16mm 2 and 30nm, the value of the slope in the figure is 114.0...
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