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Composite carrier network for immunoelectron microscope-X-ray microscopic imaging-nano ion probe technology and preparation method thereof

An electron microscope and microscopic imaging technology, which is applied in the manufacture of discharge tubes/lamps, ion implantation and plating, electrode system manufacture, etc. problems, to achieve good support strength and electrical conductivity, reduce the probability and degree of damage, and improve the effect of the observation range

Active Publication Date: 2019-07-12
INST OF HIGH ENERGY PHYSICS CHINESE ACADEMY OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] 1) There is no support system under the central silicon nitride pane. Since IEM sample preparation requires complex immunolabeling operations, the central pane is likely to be damaged during the process. In severe cases, the entire silicon nitride pane frame will be fragmented, resulting in Some panes and even sample sections fall off;
[0007] 2) The size of the pane is 0.5x0.5mm, and the amount of biological slices that can be placed is small, which relatively reduces the probability of the occurrence of the region of interest and affects the efficiency of the experiment;
[0008] 3) The coordinates are marked on the edge, and the operation of locating the region of interest in the sample slice is complicated and time-consuming;
[0009] 4) When performing Nano-SIMS analysis, due to the presence of 2 μm pores in the central pane area, the efficiency of secondary particle signal detection is different

Method used

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  • Composite carrier network for immunoelectron microscope-X-ray microscopic imaging-nano ion probe technology and preparation method thereof
  • Composite carrier network for immunoelectron microscope-X-ray microscopic imaging-nano ion probe technology and preparation method thereof
  • Composite carrier network for immunoelectron microscope-X-ray microscopic imaging-nano ion probe technology and preparation method thereof

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Embodiment Construction

[0050] The technical solutions of the present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.

[0051] 1. Preparation of a composite grid for immunoelectron microscopy-X-ray microscopic imaging-nano ion probe technology

[0052] The preparation method is as follows:

[0053] 1) A molybdenum ring is selected as the support base;

[0054] 2) Apply the conductive adhesive to either side of the above-mentioned molybdenum ring, and then buckle the side coated with the conductive adhesive on the coordinate copper grid, press it flat with a glass slide, and let it dry naturally;

[0055] 3) Put the Fanghua film in a beaker filled with distilled water. The Fanghua film will float on the water surface. Place the coordinate copper mesh that is not coated with conductive glue on the Fanghua film evenly and press the coordinate copper Make the mesh close to the Fanghua membrane, cover the entire membrane with filter paper...

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Abstract

The invention provides a composite carrier network for the immunoelectron microscope-X-ray microscopic imaging-nano ion probe technology and a preparation method thereof. The composite carrier networkcomprises a molybdenum ring as a supporting substrate, and a conductive paste, a coordinate copper mesh, an aromatic film, a conductive carbon film, a silicon nitride film and a conductive carbon film are sequentially set on the substrate. The composite carrier network has the advantages of good support strength and electrical conductivity, the positioning information of a region of interest in asample can be provided, the three technologies of IEM, STXM-XANES and Nano-SIMS can be successfully combined, the in-situ analysis of protein information, elemental chemical morphological informationand isotope information is carried out on the region of interest in an electron microscopy sample with the thickness of 70-100nm, at the same time, the probability and extent of damage during an IEMsample labeling operation can be reduced, the observation range is effectively improved, the accurate positioning of STXM and Nano-SIMS analysis is achieved, and the detection efficiency of the Nano-SIMS analysis is greatly improved.

Description

technical field [0001] The invention relates to the technical field of microscope grid preparation, in particular to a composite grid simultaneously applied to immunoelectron microscopy-X-ray microscopic imaging-nano ion probe technology and a preparation method thereof. Background technique [0002] At present, new drugs have great application prospects in the medical field, and can be used in imaging diagnosis, tissue repair, photothermal therapy, drug carriers, etc. The current research results show that generally new drugs will be taken up by the reticuloendothelial system (liver, spleen, etc.) after entering the body, while some specially modified new drugs will be targeted and transported to specific tissues (mainly tumor sites). Under different cellular microenvironments, the physical and chemical properties of new drugs will change, and through complex degradation and metabolic processes, they may cause different biological effects. Discovering this series of in viv...

Claims

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Application Information

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IPC IPC(8): H01J37/20H01J37/26H01J9/00C23C14/06C23C16/34C23C28/04
CPCC23C14/0605C23C16/345C23C28/04H01J9/00H01J37/20H01J37/26
Inventor 何潇张珺哲
Owner INST OF HIGH ENERGY PHYSICS CHINESE ACADEMY OF SCI
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