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Microwave reduction preparation method of hydroxylated graphene coated atomic force microscope probe

A hydroxylated graphene, atomic force microscope technology, applied in scanning probe technology, scanning probe microscopy, measuring devices and other directions, can solve the problems of many impurities coated on the tip of the needle, cannot be prepared on a large scale, and high production costs, and achieves Avoid contamination, extend service life, reduce the effect of rapid wear

Inactive Publication Date: 2019-11-29
YANCHENG TEACHERS UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the current related preparation methods, such as impregnation method, transfer method, etc., still have the shortcomings of too many impurities coated on the needle tip, which cannot be prepared on a large scale, the process is very complicated, and the production cost is high.

Method used

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  • Microwave reduction preparation method of hydroxylated graphene coated atomic force microscope probe
  • Microwave reduction preparation method of hydroxylated graphene coated atomic force microscope probe
  • Microwave reduction preparation method of hydroxylated graphene coated atomic force microscope probe

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0029] (1) 0.3g anhydrous FeCl 3 Mix evenly with 0.05g of expanded graphite, vacuum-tightly seal it in a 20mL vacuum ampoule, raise the temperature to 380°C in 1h, and maintain it for 12h. The black product was dissolved in dilute hydrochloric acid solution, filtered and dried for use.

[0030] (2) Take out the intercalation compound, disperse it in 50mL organic solvent N-methylpyrrolidone, prepare a 5mg / mL suspension, add 10mL sodium borohydride alkaline aqueous solution to the container, and ultrasonically react for 1h to obtain a graphene material , wash and set aside.

[0031] (3) 20mL H 2 SO 4 Maintained in ice water (0° C.) for 0.5 h, added 30 mg of the original graphene material into concentrated sulfuric acid, and stirred for 10 min.

[0032] (4) Put 120 mg of sodium chlorate into a solution of concentrated sulfuric acid and graphene, stir at room temperature for 4 hours, and repeat centrifugal washing and drying of the product.

[0033] (5) Put the hydroxylated g...

Embodiment 2

[0037] (1) 0.3g anhydrous FeCl 3 Mix evenly with 0.05g of expanded graphite, vacuum-tightly seal it in a 20mL vacuum ampoule, raise the temperature to 380°C in 1h, and maintain it for 12h. The black product was dissolved in dilute hydrochloric acid solution, filtered and dried for use.

[0038] (2) Take out the intercalation compound, disperse it in 50mL organic solvent N-methylpyrrolidone, prepare a 5mg / mL suspension, add 10mL sodium borohydride alkaline aqueous solution to the container, and ultrasonically react for 1h to obtain a graphene material , wash and set aside.

[0039] (3) 20mL H 2 SO 4 Maintained in ice water (0° C.) for 0.5 h, added 30 mg of the original graphene material into concentrated sulfuric acid, and stirred for 10 min.

[0040] (4) Put 120 mg of sodium chlorate into a solution of concentrated sulfuric acid and graphene, stir at room temperature for 4 hours, and repeat centrifugal washing and drying of the product.

[0041] (5) Put the hydroxylated g...

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Abstract

The invention provides a microwave reduction preparation method of a hydroxylated graphene coated atomic force microscope probe. The preparation method comprises the following steps of preparing a hydroxylated graphene material to obtain a hydroxylated graphene aqueous solution; immersing the tip of the atomic force microscope probe with metal layers on the cantilever and the tip into the hydroxylated graphene solution, mechanically stirring, taking out and naturally airing; and carrying out microwave treatment so that the metal layer can effectively absorb microwave energy and hydroxyl and epoxy groups are removed. According to the method, the obtained hydroxylated graphene material is small in the oxidation amount, far better than intrinsic graphene in dispersity, is more favorable for being attached to the surface of the atomic force microscope probe and is tight and uniform in coating, the service life of the probe is prolonged, and the loss of the probe is reduced.

Description

technical field [0001] The invention relates to the field of atomic force microscopy, in particular to a microwave reduction preparation method for hydroxylated graphene-coated atomic force microscopy probes. Background technique [0002] Atomic force microscope (AFM) is an important instrument for the analysis of surface topography and electromagnetic properties with atomic resolution. The probe composition of atomic force microscope is generally silicon or silicon nitride, the probe tip radius is generally 10 to tens of nm, and the microcantilever is usually a silicon wafer or silicon nitride with a length of 100-500 μm, a width of 10-50 μm and a thickness of 500 nm-5 μm piece. Plating 10-50nm thick metal platinum, titanium, chromium, platinum or iridium on the surface of ordinary probes to obtain conductive AFM probes. However, the conductive coating of conductive AFM probes is easy to wear during use, which makes it difficult to effectively maintain its conductivity fo...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01Q60/38G01Q70/16
CPCG01Q60/38G01Q70/16
Inventor 苗中正张立云
Owner YANCHENG TEACHERS UNIV
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