Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A solar-blind ultraviolet single-photon avalanche detector

A single-photon avalanche and detector technology, applied in photovoltaic power generation, semiconductor devices, final product manufacturing, etc., can solve the problems of fast dynamic parameter changes, cost consumption, inconvenient integration, etc., achieve good preparation and integration, reduce packaging costs, The effect of reducing the production cost

Active Publication Date: 2021-09-07
NANTONG UNIVERSITY
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the traditional quenching circuit design is relatively complicated, limited by the electrical parasitic parameters of the SPAD. In the Geiger mode, only considering the static parameters of the APD will make the result inaccurate, but the dynamic parameters change quickly, and a more accurate SPAD equivalent circuit model needs to be designed.
Sometimes the quenching circuit is based on passive quenching and improved with an active charging circuit. Although it can improve the detection efficiency, it also takes up more area and is not easy to integrate, making it difficult to increase the duty cycle of the detector.
It takes a long time to quench and reset during operation, which increases power consumption, reduces the detection performance of the diode, reduces reliability and stability, and is very costly.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A solar-blind ultraviolet single-photon avalanche detector
  • A solar-blind ultraviolet single-photon avalanche detector

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0035] See figure 1 , the solar-blind ultraviolet single-photon avalanche detector of this embodiment includes a voltage source 1 , an avalanche photodetector 2 and a plurality of nanowires 3 .

[0036] Avalanche photodetector 2 is a sun-blind ultraviolet AlGaN avalanche photodetector working in Geiger mode. See figure 2 , the avalanche photodetector 2 sequentially includes a substrate layer 21 , an n-type layer 22 , an i-type absorbing layer 23 , an n-type separation layer 24 , an i-type avalanche layer 25 and a p-type layer 26 from bottom to top. An n-type ohmic contact electrode 27 and a p-type ohmic contact electrode 28 are respectively provided on the n-type layer 22 and the p-type layer 26 . The n-type ohmic contact electrode 27 and the p-type ohmic contact electrode 28 are the negative electrode and the positive electrode of the avalanche photodetector 2 respectively. The bottom surface of the substrate layer 21 is the photosensitive surface of the avalanche photode...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
diameteraaaaaaaaaa
Login to View More

Abstract

The invention discloses a sun-blind ultraviolet single-photon avalanche detector, which includes an avalanche photodetector and a plurality of nanowires; the avalanche photodetector is a sun-blind ultraviolet aluminum gallium nitrogen avalanche photodetector working in a Geiger mode The nanowires are gallium nitride nanowires with negative photoconductive effect; the multiple nanowires are arranged on the photosensitive surface of the avalanche photodetector; the positive ends of the multiple nanowires are connected in parallel to the voltage source positive electrode; the negative ends of the plurality of nanowires are connected in parallel to the negative electrode of the avalanche photodetector; the positive electrode of the avalanche photodetector is connected to the negative electrode of the voltage source. The invention uses the negative photoconductive effect of the nanowire to work, so that the avalanche current in the avalanche detector is quenched in time after the avalanche breakdown, and the protection diode does not need the traditional quenching circuit, avoiding the large area occupied by the quenching circuit , Inconvenient integration, and very costly.

Description

technical field [0001] The invention relates to an avalanche detector, in particular to a sun-blind ultraviolet single-photon avalanche detector integrating a nanowire protection circuit. Background technique [0002] In recent years, the research work of semiconductor nanowires has made great progress, and its application fields include integrated circuits, transistors, lasers, light-emitting diodes, single-photon devices, and solar cells. Among them, among many semiconductor materials, GaN-based semiconductor materials have a wide direct band gap, and are widely used in high-frequency, High-temperature, high-power electronic devices and optoelectronic devices have become the third-generation semiconductor materials after the first-generation germanium and silicon semiconductor materials and the second-generation gallium arsenide and indium phosphide compound semiconductor materials. Therefore, the preparation of GaN nanowires has become a research hotspot. [0003] The a...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L31/0304H01L31/105H01L31/107H01L31/18B82Y15/00B82Y30/00
CPCB82Y15/00B82Y30/00H01L31/03044H01L31/03048H01L31/105H01L31/107H01L31/1848H01L31/1856Y02E10/544Y02P70/50
Inventor 余晨辉李林陈红富徐腾飞
Owner NANTONG UNIVERSITY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products