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Resonance wavelength determination method of surface electromagnetic mode resonance hyperspectral imaging sensor

A technology of hyperspectral imaging and resonance wavelength, which is applied in the directions of radiation pyrometry, spectrometry/spectrophotometry/monochromator, color/spectral characteristic measurement, etc., and can solve the sensitivity of centroid method to spectral waveform asymmetry , Computing speed and accuracy can not be taken into account, the resonance wavelength is uncertain offset and other problems, to achieve fast computing speed, which is conducive to accurate determination and improve the effect of quality factor

Active Publication Date: 2021-03-19
AEROSPACE INFORMATION RES INST CAS +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Although these methods can calculate the resonance wavelength more accurately, there are still some shortcomings. For example, the first-order derivative zero-point method and the local similarity matching method are fast but susceptible to noise, and the centroid method is sensitive to the asymmetry of the spectral waveform. , the calculated resonance wavelength will produce an uncertain offset. The function fitting method has strong anti-noise ability and high resolution accuracy, but the function form used for fitting the resonance region is fixed, and its operation speed and accuracy sexual incompatibility

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  • Resonance wavelength determination method of surface electromagnetic mode resonance hyperspectral imaging sensor
  • Resonance wavelength determination method of surface electromagnetic mode resonance hyperspectral imaging sensor
  • Resonance wavelength determination method of surface electromagnetic mode resonance hyperspectral imaging sensor

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Embodiment 1

[0059] In the first exemplary embodiment of the present invention, a method for determining the resonance wavelength of a surface electromagnetic mode resonance hyperspectral imaging sensor is provided, and the sensor includes a broadband light source, a surface electromagnetic mode resonance structure and a hyperspectral imager. figure 1 A flow chart of the method for determining the resonance wavelength of the present invention, such as figure 1 As shown, the resonance wavelength determination method of the present invention comprises the following steps:

[0060] Step 1: Using a hyperspectral imager to measure the original emission spectrum curve of the broadband light source, based on the instrument response function of the hyperspectral imager, the measured emission spectrum original curve is converted into an emission spectrum radiance curve independent of the instrument response.

[0061] In different embodiments, the hyperspectral imager can be a commercially available...

Embodiment 2

[0084] In the second exemplary embodiment of the present invention, the verification of the effect of the method for determining the resonance wavelength of the surface electromagnetic mode hyperspectral imaging sensor of the present invention in improving the quality factor of the surface electromagnetic mode resonance sensor is provided.

[0085] In this embodiment, the broadband light source is an example of an AVALIGHT-HAL-S-MINI type halogen tungsten lamp (Beijing Avantis Company), and the coupling prism is a 45° / 45° / 90° glass prism (refraction corresponding to a wavelength of 633nm The ratio is 1.799, Beijing Beidong Optoelectronics Automation Development Company) as an example, the hyperspectral imager uses GaiaField Pro V10E portable hyperspectral imager (Sichuan Shuangli Hepu Company) as an example, and the surface electromagnetic mode resonance chip uses a 1mm thick glass substrate The surface plasmon resonance (SPR) sensor chip with a 50nm thick gold-silver alloy fil...

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Abstract

The invention discloses a resonance wavelength determination method of a surface electromagnetic mode resonance hyperspectral imaging sensor. The method comprises the following steps of: measuring anemission spectrum original curve of a broadband light source and a resonance spectrum original curve of a surface electromagnetic mode resonance structure by using a hyperspectral imager; converting the emission spectrum original curve into an emission spectrum radiance curve, converting the resonance spectrum original curve into a resonance spectrum radiance curve, enabling the resonance spectrumradiance curve to comprise a resonance absorption curve segment and a non-resonance curve segment; taking the emission spectrum radiance curve as a fitting model, carrying out overall fitting on thenon-resonance curve segment in the resonance spectrum radiance curve, so as to obtain a radiance optimal fitting curve of the sensor in the absence of resonance absorption; dividing the resonance spectrum radiance curve by the radiance optimal fitting curve to obtain a reflectivity spectrum curve; and fitting a resonance absorption valley in the reflectivity spectrum curve to determine a resonancewavelength. With the method adopted, the resonance wavelength can be accurately calculated, and the quality factor of the sensor is improved.

Description

technical field [0001] The invention relates to the technical field of surface electromagnetic mode resonance spectrum sensing, in particular to a method for determining a resonance wavelength of a surface electromagnetic mode resonance hyperspectral imaging sensor. Background technique [0002] Surface plasmon resonance (SPR) sensing technology has the advantages of high sensitivity, good surface selectivity, label-free, anti-electromagnetic interference, in-situ real-time detection, etc., and is widely used in biology, chemistry, medicine and other fields. SPR sensing methods are divided into four types: wavelength detection type, angle detection type, phase detection type, and intensity detection type. Among them, the wavelength detection type has simple equipment, convenient operation, and wide dynamic range, and is a more commonly used method. During the wavelength detection process, the shape of the original curve of the SPR resonance spectrum obtained by the CCD spect...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/552G01N21/25G01J3/28G01J3/42G01J3/10
CPCG01N21/553G01N21/25G01J3/2823G01J3/42G01J3/10G01J2003/425
Inventor 祁志美刘紫威尹涛蔡宸蔡新霞
Owner AEROSPACE INFORMATION RES INST CAS
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