Silicon carbide wafer one-way three-time two-way six-step cutting process
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- 西安晟光硅研半导体科技有限公司
- Publication Date
- 2021-04-09
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Abstract
Description
Technical field
[0001] The present invention relates to the field of silicon carbide wafer cutting processes, and more particularly to a silicon carbide wafer single-directional three-way hexahedral cutting process.Background technique
[0002] SiC single crystal is a typical hardcod, which has a macquard hardness of 9.2 to 9.5, second only to diamond, which makes the processing and manufacturing process of SiC single crystal substrates more difficult. At present, the manufacturing process of the SiC single crystal substrate can be divided into cutting → rough research → fine research → polished several stages. Cutting as a primary critical process for manufacturing SiC single crystal substrates, the processing quality directly affects the material removal of subsequent steps, and finally processing quality (surface roughness and flatness), product productivity and processing cost, etc.. With the development of crystal growth and market demand, the demand for large diameter SiC single cry...