Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for adjusting and controlling DM interaction of ferromagnetic multilayer film

A multi-layer film and ferromagnetic technology, applied in the field of high-density information storage and sensing, can solve the problems of difficult insulation, poor control uniformity, breakdown, etc., and achieve reduced surface roughness, good surface quality, and reduced oxidation layer effect

Active Publication Date: 2021-06-25
UNIV OF SCI & TECH BEIJING
View PDF12 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, since the oxides in the above system are generally only a few nanometers, it is difficult to ensure good insulation. At this time, when a high voltage is applied, it may cause breakdown or short circuit, which will affect the effect and uniformity of regulation to a certain extent.
At the same time, due to the charge shielding effect of metal materials, this method of electric field manipulation of DM interaction is difficult to be directly applied to commonly used pure metal thin film systems such as Pt / Co / Ta, Ir / Fe / Co / Pt, etc.
In summary, although some research work has been carried out on the regulation of the DM interaction of thin film materials in the world, the existing regulation methods rely on special material systems, cannot achieve dynamic regulation after film formation, or have poor regulation uniformity. Therefore, how to efficiently and simply control the DM interaction of ferromagnetic metal multilayer films has important scientific significance and practical value for the development of a new generation of spintronic memory devices.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for adjusting and controlling DM interaction of ferromagnetic multilayer film
  • Method for adjusting and controlling DM interaction of ferromagnetic multilayer film
  • Method for adjusting and controlling DM interaction of ferromagnetic multilayer film

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0018] figure 1 The sample preparation conditions are as follows: firstly, the Si substrate with a thickness of 0.5 mm is cut into a suitable size, and the surface acidification treatment and heat treatment are carried out on it. Hydrofluoric acid is used for the surface acidification treatment, the pH value of the acidification treatment is 6, and the acidification time is 3 minutes. Afterwards, the substrates were ultrasonically cleaned with alcohol and acetone solutions respectively, the cleaning sequence was first the acetone solution and then the alcohol solution, and were cleaned twice, each time for 10 minutes. Then, utilize the magnetron sputtering method to sequentially deposit Pt atoms (with a thickness of ), Co atoms (thickness is ) and Ta atoms (thickness is ), the sputtering powers were 15W, 18W and 30W, respectively, to prepare Si substrates multilayer film. The background vacuum of the sputtering chamber is 1×10 -5 Pa, the flow rate of argon gas during...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
thicknessaaaaaaaaaa
thicknessaaaaaaaaaa
thicknessaaaaaaaaaa
Login to View More

Abstract

The invention discloses a method for adjusting and controlling interaction of a ferromagnetic multilayer film, belongs to the technical field of high-density information storage and sensing, and relates to a method for adjusting and controlling DM interaction of a ferromagnetic multilayer film. The platinum (Pt) / cobalt (Co) / tantalum (Ta) multilayer film is deposited on a Si substrate which is subjected to surface acidizing treatment and ultrasonic cleaning. After deposition is completed, As ions are implanted into the film, the spin-orbit coupling strength of the multilayer film is influenced through As ion adjustment and electron orbit occupation at an interface, and therefore the DM interaction of the ferromagnetic multilayer film is adjusted and controlled. According to the method, orbit occupation of the multilayer film interface is directly adjusted through an As ion implantation method, and therefore the spin-orbit coupling effect is changed, the DM interaction of the multilayer film interface is finally adjusted and controlled, and the method does not depend on a special material system and has universality; and according to the method, different degrees of adjustment and control of DM interaction can be realized by changing parameters such as an implanted ion source, implanted energy and implanted density, the process is simple, the cost is low, controllability is high, and the method can be applied to the spintronics technology in the future.

Description

technical field [0001] The invention belongs to the technical field of high-density information storage and sensing, and relates to a method for controlling the DM interaction of a key core material unit in the above-mentioned field—a ferromagnetic metal multilayer film. Electron orbital occupation and spin-orbit coupling at the interface to regulate the DM interaction of ferromagnetic multilayer films. Background technique [0002] In ferromagnetic (FM) multilayers, strong interfacial Dzyaloshinskii-Moriya (DM) interactions occur when ferromagnetic layers are in contact with heavy metals (HM) with large spin-orbit coupling (SOC). The DM interaction is an antisymmetric exchange interaction that favors the neighboring spin S 1 and S 2 The use of this special spin structure can realize information storage, so it has the potential to be used in future high-density, low-power magnetic storage logic devices. However, there are still many problems to be solved during its applic...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): C23C14/02C23C14/16C23C14/35C23C14/48
CPCC23C14/165C23C14/35C23C14/48C23C14/021
Inventor 冯春赵永康孟飞祝荣贵于广华
Owner UNIV OF SCI & TECH BEIJING
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products