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Amorphous Ga2O3 solar-blind ultraviolet detector based on MgO passivation and preparation method thereof

An ultraviolet detector, amorphous technology, applied in the field of ultraviolet detection, can solve the problems of limited substrate selection, slow reaction time, thermal budget increase, etc., achieve stable detection performance, increase wavelength selectivity, improve response time and response degree of effect

Active Publication Date: 2022-07-29
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the presence of oxygen vacancies also leads to extremely slow reaction times of a few seconds
In addition, β-Ga 2 o 3 The formation of the monoclinic phase requires high processing temperatures (>650°C), leading to a sharp increase in the thermal budget and limiting the choice of substrates

Method used

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  • Amorphous Ga2O3 solar-blind ultraviolet detector based on MgO passivation and preparation method thereof
  • Amorphous Ga2O3 solar-blind ultraviolet detector based on MgO passivation and preparation method thereof
  • Amorphous Ga2O3 solar-blind ultraviolet detector based on MgO passivation and preparation method thereof

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Experimental program
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Effect test

Embodiment 1

[0074] Amorphous Ga based on MgO passivation 2 O 3 A solar-blind UV detector, a plasma-enhanced atomic layer deposition (PE-ALD) based amorphous a-Ga 2 O 3 A solar-blind photodetector with high responsivity and fast response time of thin film, through preparation of substrate technology, ultraviolet lithography technology (preferably using contact ultraviolet lithography machine) processing technology and atomic layer deposition equipment (preferably using Picsun 200R plasma volume-enhanced atomic layer deposition equipment) treatment process; and when the atomic layer deposition equipment is processed, (cyclopentadienyl) magnesium (MgCp 2 ), triethylgallium (TEG) and oxygen as Mg source, Ga source and O source, that is, in the preparation, (cyclopentadienyl)magnesium, TEG and oxygen were used as Ga (gallium) source and O ( The reaction precursor of the oxygen) source is sent into the reaction chamber of the atomic layer deposition equipment, and the resulting amorphous Ga ...

Embodiment 2

[0080] This embodiment is further optimized on the basis of the above-mentioned embodiment, and the same parts as the above-mentioned technical solutions will not be repeated here. Further, in order to better realize the amorphous Ga based on MgO passivation described in the present invention 2 O 3 The solar-blind ultraviolet detector, in particular, adopts the following setting method: the process for preparing the substrate includes the following steps:

[0081] 1.1) Cut a large piece of raw material as a substrate into 1×1cm 2 size, forming a substrate;

[0082] 1.2) load the cut substrate into the quartz tube, add soapy water for ultrasonic cleaning 15-30min (preferably 15min);

[0083] 1.3) rinse the soapy water in the quartz tube with deionized water, then use deionized water ultrasonic cleaning two-four times (preferably 2 times), single 15-30min (preferably 15min);

[0084] 1.4) After step 1.3), use acetone and ethanol to carry out ultrasonic cleaning respectively f...

Embodiment 3

[0087] This embodiment is further optimized on the basis of any of the above-mentioned embodiments, and the same parts as the previous technical solutions will not be repeated here, and further to better realize the amorphous Ga based on MgO passivation described in the present invention 2 O 3 The solar-blind ultraviolet detector especially adopts the following setting method: the ultraviolet lithography technology processing process includes the following steps:

[0088] 2.1) Pretreatment, place the substrate obtained in step 1) on a heating table and heat it at 110-120°C (preferably 110°C) for 5-10min (preferably 5min) to remove the residual water vapor on the surface of the substrate to prevent influence Adhesion between photoresist and substrate;

[0089] 2.2) Glue homogenization, in the process of glue homogenization, the rotation speed is completed in two steps, first at 500~600r / min (preferably 500r / min), lasting 5~7s (preferably 5s) low speed rotation, and then rising...

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Abstract

The invention discloses an amorphous Ga2O3 solar-blind ultraviolet detector based on MgO passivation and a preparation method of the amorphous Ga2O3 solar-blind ultraviolet detector, and solves the problems that an existing amorphous Ga2O3 solar-blind ultraviolet detector has many defects, so that the response time of the device is slow, and the device cannot work in a high-temperature environment. The amorphous Ga2O3 solar blind ultraviolet detector is obtained through a substrate preparation process, an ultraviolet lithography technology processing process and an atomic layer deposition equipment processing process. When the atomic layer deposition equipment treatment process is carried out, (cyclopentadienyl) magnesium, TEG and oxygen are respectively adopted as a Mg source, a Ga source and an O source; the preparation method comprises the following steps: firstly, cutting and cleaning a large raw material to obtain a substrate with the size of 1 * 1cm < 2 >; preparing an interdigital electrode pattern on the substrate by adopting a negative photoresist photoetching method, and preparing a gold electrode on the upper surface of the substrate by adopting a double-source electron beam physical vapor deposition method to form a primary product; and finally, depositing an MgO passivation layer thin film and an amorphous Ga2O3 thin film on the upper surfaces of the substrate and the interdigital electrode on the primary product by adopting a plasma enhanced atomic layer deposition method.

Description

technical field [0001] The invention relates to the technical field of ultraviolet detection, in particular, to amorphous Ga based on MgO passivation 2 O 3 Solar blind ultraviolet detector and preparation method thereof. Background technique [0002] Over the past few years, most Ga 2 O 3 DUV solar blind photodetectors are all based on β-Ga 2 O 3 Monoclinic wafers, epitaxially grown on sapphire substrates by molecular beam epitaxy (MBE), chemical vapor deposition (CVD) or pulsed laser deposition (PLD) processes. Solar-blind light detection characteristics mainly depend on β-Ga 2 O 3 The crystalline quality of thin films is affected by the substrate hotspot array matching, growth temperature, deposition rate, and annealing conditions. Reference [1] is {Ramana C, Rubio E, Barraza C, Gallardo A, McPeak S, Kotru S and Grant J 2014 Chemical bonding, optical constants, and electrical resistivity of sputter-deposited gallium oxide thinfilms. J.Appl.Phys.115043508. } based...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L31/0216H01L31/032H01L31/0376H01L31/09H01L31/18
CPCH01L31/095H01L31/18H01L31/0216H01L31/0376H01L31/032Y02P70/50
Inventor 李严波范泽宇
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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