CMOS comparator

A technology of oxide semiconductors and complementary metals, which is applied in the direction of instruments, differential amplifiers, DC-coupled DC amplifiers, etc., can solve the problems of reducing the speed of comparators, increasing costs, and unable to eliminate the influence, and achieves high precision and high speed.

Inactive Publication Date: 2006-11-15
SOUTHEAST UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although input offset storage and output offset storage can greatly reduce the input offset voltage of the comparator, these two offset cancellation techniques need to add an offset storage capacitor to the signal transmission path, which reduces the speed of the comparator, and it cannot eliminate the transistor switch. The effect of channel charge injection and clock feedthrough on the input offset voltage caused by
For on-chip resistor laser trimming, the calibration process is only performed once during chip manufacturing, which requires the circuit to have time and temperature stability, and requires additional calibration procedures, increasing costs

Method used

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Embodiment Construction

[0012]A complementary metal oxide semiconductor comparator circuit is composed of first, second and third stage differential input pre-amplifiers 1, 2 and 3, an output latch 4 and a feedback offset adjustment circuit 5. The first differential amplifier 1 is composed of bias current transistor P1, bias current transistor P2, differential input transistors P3 and P4, cascaded PMOS transistors P5 and P6, clamping PMOS transistor P7, switch transistors N1, N2 and N8, bias The current tube N3, the load tubes N4, N5, N6 and N7, and the capacitor C0 are composed. The gate terminals of the switch tubes N1 and N2 are connected to the clock signal W0, the source terminal is connected to the bias voltage Vref, and the drain terminals are connected to the gates of the differential input transistors P3 and P4. The source terminal of the bias current tube P1 is connected to the power supply VDD, the gate terminal is connected to the drain terminal and is connected to the gate terminal of the...

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Abstract

The invention discloses a complementary metal oxide semiconductor comparator. The feedback offset adjustment circuit (5) is composed of a switched capacitor filter (6) and a voltage adjustment circuit (7). The output terminal WA1 of the output latch (4) is connected to the The input terminal of the switched capacitor filter (6) is connected, the output terminal of the switched capacitor filter (6) is connected with the input terminal of the voltage regulation circuit, the output terminal of the voltage regulation circuit is connected with one end of the comparator offset calibration capacitor C3, and the comparator offset The other end of the calibration capacitor C3 is connected to the input terminal IN of the first-stage amplifier (1), one end of the symmetrical capacitor C4 of the comparator offset calibration capacitor C3 is connected to the inverting input terminal INR of the first-stage amplifier (1), the other end is grounded, and the switched capacitor Filter (6) is made up of first branch (61) and second branch (62), and first branch (61) is made up of first transmission gate TF1 and second transmission gate TF2, and second branch (62 ) is composed of an inverter INV4, a third transmission gate TF3 and a fourth transmission gate TF4, the input terminal of the inverter INV4 is connected to the output terminal WA1 of the output latch.

Description

technical field [0001] The invention relates to a comparator circuit suitable for successive approximation analog-to-digital converters, pipeline structure analog converters and other high-precision comparators, in particular to a complementary metal-oxide-semiconductor comparator. Background technique [0002] Speed ​​and precision are two of the most important characteristics of analog circuits, especially in high-speed and high-precision analog-to-digital converters (ADCs). However, the speed and accuracy of the ADC circuit are usually determined by the accuracy and speed of the comparator, because the comparator input offset and delay directly affect the accuracy and speed of the analog-to-digital converter circuit. Due to process drift, the mismatch of circuit elements in the comparator makes the comparator input offset voltage usually about 50mV. Therefore, in order to meet the high-precision analog-to-digital converter (ADC) design, it is ne...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H03K5/24H03F3/45H03M1/34
Inventor 吴建辉吴光林茆邦琴饶进时龙兴
Owner SOUTHEAST UNIV
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