PTC composite, its manufacturing method and obtained thermosensitive electronic material therefrom
A manufacturing method and technology of thermistors, applied to resistors with a positive temperature coefficient, conductive materials dispersed in non-conductive inorganic materials, resistors, etc., can solve problems such as low heat resistance and thermal shock resistance , to achieve the effect of excellent heat resistance and thermal shock resistance, high density
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Embodiment 1
[0090] 57% by volume of linear low-density polyethylene (melting point 122°C, specific gravity 0.93) produced using a metallocene catalyst as a polymer matrix, and 8% by volume of ethylene homopolymer (melting point 99°C) as a low-melting organic compound , mixed with 35% by volume of filiform nickel powder (average particle diameter 0.5-1.0 μm) having spike-shaped protrusions as a conductive substance, and then added 0.5% by weight of phenol-based and sulfur-based antioxidants relative to the total organic components Thereafter, it was kneaded in a mill for 30 minutes while heating at 150° C. to obtain a kneaded product (mixture).
[0091] The obtained kneaded product was sandwiched between Ni foils with a thickness of 25 μm, and the Ni foil was bonded to the kneaded product with a hot press set at 150° C. to obtain a molded product with a thickness of 300 μm including electrodes.
[0092] An electron beam having an acceleration voltage of 2000 kV was irradiated at a time wit...
Embodiment 2
[0105] Except that the irradiation amount of the electron beam is set to 100kGy, and this is divided into 5 times and irradiates 20kGy at a time, all the other are the same as in Example 1 to obtain a thermistor element sample, which is subjected to the same procedure as in Example 1. evaluate. The result of the various characteristics of embodiment 2 is shown in table 1, and R-T curve is as image 3 shown.
Embodiment 3
[0107] Except that the irradiation amount of the electron beam is set to 200kGy, and this is divided into 10 times and irradiates 20kGy each time, all the other are the same as in Example 1 to obtain a thermistor element sample, which is subjected to the same procedure as in Example 1. evaluate. The result of the various characteristics of embodiment 3 is shown in table 1, and R-T curve is as image 3 shown.
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Abstract
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