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Semiconductor integrated circuit and data processing system

Inactive Publication Date: 2011-08-11
RENESAS ELECTRONICS CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0015]To sum up, the following advantageous effects are provided according to the representative aspects of the present invention:
[0016]In accordance with the present invention, on a small chip occupancy area, it is possible to implement an arrangement for detecting local light irradiation in an illegal attack attempt to intentionally induce a malfunction or faulty condition.
[0017]Further, in accordance with the present invention, it is possible to enhance detection sensitivity to local light irradiation.

Problems solved by technology

A microcomputer embedded in an IC card to be used for such a purpose as user authentication (called a security microcomputer) might be subjected to a fault-based attack that intentionally induces a malfunction or faulty condition for illegally obtaining or tampering with secret information held in the IC card.
A fault-based attack using laser light irradiation is regarded as one of the most serious security threats since a malfunction can be forced to occur in a local portion.

Method used

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  • Semiconductor integrated circuit and data processing system
  • Semiconductor integrated circuit and data processing system
  • Semiconductor integrated circuit and data processing system

Examples

Experimental program
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Effect test

embodiment 1

Preferred Embodiment 1

[0081]Referring to FIG. 2, there is shown a block diagram of a microcomputer (MCU) 1 according to a preferred embodiment 1 of the present invention. The microcomputer 1 shown in FIG. 2 is an exemplary semiconductor integrated circuit concerned with the present invention, and for example, the microcomputer 1 is formed over a single semiconductor substrate made of single-crystal silicon or the like by such a semiconductor device manufacturing technique as a complementary MOS integrated circuit fabrication technique.

[0082]The microcomputer 1 is used as a so-called IC-card microcomputer that is specifically applied to secure processing such as user authentication, though not particularly limited thereto.

[0083]In the microcomputer 1, there are included a mask ROM 3 as a fixed memory device, an EEPROM 4 as an electrically rewritable nonvolatile memory device, and a RAM 2 as a volatile memory device, though not particularly limited thereto. The microcomputer 1 further...

embodiment 2

Preferred Embodiment 2

[0107]Referring to FIG. 22, there is shown a basic circuit configuration wherein detection diodes used as photodetector elements D are disposed in parallel in the logic circuit 6.

[0108]In a region containing the logic circuit 6, there are distributively disposed a plurality of series-coupled buffers that are arranged to have a constant logical value of primary-stage input, e.g., a high-level logical value “1”. A plurality of detection diodes 200 are parallel-coupled in a reverse-biased state between a ground voltage Vss and a signal path PSS extending from an input of one of the buffers 201 to an output of a buffer 201 located at a stage anterior thereto. That is, the cathode of each detection diode 200 is coupled to the signal path PSS, and the anode thereof is coupled to the ground voltage. Reference numeral 203 in FIG. 22 indicates a logic-matching inverter. An inverted signal of an output from the last-stage buffer 201 is fed to a set terminal of a set / rese...

embodiment 3

Preferred Embodiment 3

[0126]Referring to FIG. 31, there is shown a data processing system employing the microcomputer 1 described above. As an exemplary IC card used for data processing, a multi-function SIM (Subscriber Identity Module) card 301 is indicated in FIG. 31. The multi-function SIM card 301 is mounted on such an apparatus as a mobile telephone, a mobile data terminal, or a personal computer (PC) for the purpose of user authentication in mobile communication, specific transactions, or the like. Reference numeral 302 in FIG. 31 indicates a host unit (HOST) on which the multi-function SIM card 301 is mounted. Interfacing with the HOST 302 is provided by using a cable 303, for example.

[0127]The multi-function SIM card 301 comprises an interface controller (CNT) 306, a flash memory (FLASH) 307 serving as an electrically rewritable nonvolatile memory, and a microcomputer 1 (mounted on a circuit board not shown). The interface controller 306 includes a host interface (HIF) 310, ...

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PUM

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Abstract

An arrangement for detecting local light irradiation in an illegal attack attempt to intentionally induce a malfunction or faulty condition is formed on a small chip occupancy area so as to provide high detection sensitivity. In a region containing a logic circuit, a plurality of series-coupled detection inverters are distributively disposed as photodetector elements having a constant logical value of primary-stage input. When at least one of the series-coupled detection inverters is irradiated with light, an output thereof is inverted, thereby producing a final output through the series-coupled detection inverters. Based on the final output thus produced, local light irradiation can be detected.

Description

CROSS-REFERENCE TO RELATED APPLICATIONS[0001]The disclosure of Japanese Patent Application No. 2010-23848 filed on Feb. 5, 2010 including the specification, drawings and abstract is incorporated herein by reference in its entirety.BACKGROUND OF THE INVENTION[0002]The present invention relates to a semiconductor integrated circuit capable of suppressing the occurrence of a malfunction to be intentionally induced with light irradiation, and also to a data processing system using the same. In particular, the present invention relates to a technique that is effectively applicable to a microcomputer embedded in an IC card, for example.[0003]A microcomputer embedded in an IC card to be used for such a purpose as user authentication (called a security microcomputer) might be subjected to a fault-based attack that intentionally induces a malfunction or faulty condition for illegally obtaining or tampering with secret information held in the IC card. For intentional induction of a malfunctio...

Claims

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Application Information

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IPC IPC(8): H03K3/42G06F21/75G06F21/86
CPCH03K3/42G06K19/07381
Inventor AMANUMA, YOSHIYUKITSUCHIYA, YOICHI
Owner RENESAS ELECTRONICS CORP
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