The invention discloses a method and
system for computing the stray
capacitance of a single-layer solenoid and relates to the technical field of computing of circuit parameters. The method comprises the following steps that firstly, the
radius, the number of turns, the height and the wire
diameter of the solenoid to be detected are obtained; secondly, according to the number of turns and the height, the turn interval of the solenoid to be detected is worked out; thirdly, according to the turn interval, the
radius, the number of turns and the wire
diameter of the solenoid to be detected, the stray
capacitance of the solenoid is worked out. According to the method for computing the stray
capacitance of the single-layer solenoid, the stray capacitance of the solenoid to be detected is worked out according to the physical size of the solenoid to be detected, different from some existing methods only suitable for specific occasions, the method is suitable for the single-layer solenoid with any
radius, any height, any number of turns and any wire
diameter, and the computation precision is higher compared with the existing methods.