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Design method of the semiconductor circuit device and CAD device

A computer-aided, circuit device technology, applied in computer-aided design, semiconductor device, semiconductor/solid-state device manufacturing, etc., to achieve the effect of improving resistance to soft errors without degrading overall performance

Inactive Publication Date: 2012-08-15
SOCIONEXT INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003]However, with the development of high integration and miniaturization of LSI, the charging capacity of the storage node used in the flip-flop circuit of the signal transmission circuit decreases

Method used

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  • Design method of the semiconductor circuit device and CAD device
  • Design method of the semiconductor circuit device and CAD device
  • Design method of the semiconductor circuit device and CAD device

Examples

Experimental program
Comparison scheme
Effect test

no. 1 example

[0110] The first embodiment relates to a design method of a semiconductor device that improves resistance to soft errors. use figure 1 , Figure 2A to Figure 2C , Figure 3A to Figure 3C , Figure 4A , Figure 4B , Figure 5A to Figure 5C , Figure 6A , Figure 6B and Figure 7A to Figure 7C , to illustrate the design method of the above-mentioned semiconductor device.

[0111] figure 1 It is a flowchart showing a design method of a semiconductor device with improved resistance to soft errors. and, figure 1 A means: process 1a of detecting critical path; process 1b of calculating signal delay time; process 1c of detecting longest signal delay time; process 1d of calculating output flip rate; process 2 of calculating soft error rate; judging soft error Step 3 of whether the rate is below the specified value; and Step 4 of modifying the LSI circuit in order to reduce the soft error rate.

[0112] The step 1a of detecting a critical path is roughly as follows. In ...

no. 2 example

[0171] The second embodiment relates to a signal transmission circuit having a structure that adjusts the delay time of signal transmission from a flip-flop on one side to a flip-flop on the other side, and represents an example of a signal transmission circuit that Using the above structure, the transmission circuit is modified to have the same delay time Td as the signal transmission circuit that has been determined as the critical path. Also, take advantage of Figure 8A to Figure 8D , Figure 9A to Figure 9D , Figure 10A as well as Figure 10B , to describe the signal transmission circuit of the second embodiment. and, Figure 8A to Figure 8D , Figure 9A to Figure 9D , Figure 10A as well as Figure 10B Shown are flip-flop 90, inverter 91, capacitor 92, capacitor 93, resistor 94, flip-flop circuit diagram 95, inverter circuit diagram 96, dummy circuit diagram 97, capacitor pattern 99, capacitor pattern 100, resistor pattern 101, wiring Pattern 102, groove pattern...

no. 3 example

[0188] The third embodiment is an example of modifying the main flip-flop circuit of the flip-flop in the signal transmission circuit to a circuit having a low logic inversion rate of the held signal when noise is generated due to α line or the like. Also, take advantage of Figure 11 The third embodiment will be described.

[0189] Figure 11 It is a diagram showing a circuit of a flip-flop of the signal transmission circuit of the third embodiment having a main flip-flop having a low logic inversion rate of a signal held. and, Figure 11 Shown are clock signal 110, input signal 111, inverter 112, pass transistor 113, high voltage power supply (Vcc) 114, P-type transistors 115, 116, low voltage power supply (Vss) 117, N-type transistors 118, 119 , inverters 120 , 121 , transfer gate transistor 122 , inverters 123 , 124 and output signal 125 .

[0190] The inverter 120 and the inverter 121 constitute a master flip-flop. The inverter 123 and the inverter 124 constitute a s...

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Abstract

Provided is a semiconductor circuit device in which soft error resistance is enhanced while assuring the high-speed operation of an entire LSI circuit. A CAD device includes: means for identifying a signal transmission time of each signal transmission circuit of the LSI circuit; means for identifying an output inversion ratio upon radiation exposure of a flip-flop circuit of each signal transmission circuit; means for identifying a signal transmission circuit as a critical path; means for calculating a soft error ratio of the entire LSI circuit according to the signal transmission time, the output inversion ratio, and the clock cycle; and means for lowing the soft error ratio of the entire LSI circuit without changing the signal transmission time of the signal transmission circuit as the critical path when a predetermined soft error ratio is lower than the soft error ratio of the entire LSI circuit.

Description

technical field [0001] The present invention relates to a signal transmission circuit with improved resistance to soft errors, a semiconductor device including the signal transmission circuit, a design method for the semiconductor circuit device with improved resistance to soft errors, and a CAD (computer aided design) for realizing the design method : computer-aided design) device. Background technique [0002] It is known that α-rays, neutron rays from cosmic rays, etc., generated when radioactive isotopes contained in LSI (Large Scale Integration: Large Scale Integration) packages and wiring, etc., decay Electric noise is generated in the semiconductor circuit of the LSI, causing the semiconductor circuit to malfunction. The above-mentioned erroneous operation is called a soft error (soft error) as opposed to a hard error (hard error) caused by a failure of hardware such as a semiconductor circuit. Furthermore, for DRAM (dynamic random memory; dynamic random access mem...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F17/50H03K3/037H03K19/003H01L21/82
CPCG06F17/5045H03K3/0375H01L27/0207G06F30/30
Inventor 上村大树户坂义春
Owner SOCIONEXT INC
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