Nitride light-emitting device for improving light-emitting efficiency by electron barrier layer

A technology of electron blocking layer and light-emitting device, which is applied in the direction of electrical components, semiconductor devices, circuits, etc., can solve problems such as unfavorable light fields, and achieve the effects of overcoming parasitic quantum well phenomenon, uniform light gain, and high luminous intensity

Active Publication Date: 2012-07-04
北京飓芯科技有限公司
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Problems solved by technology

However, the multi-period electron blocking layer will form a potential barrier at the well-barrier interface, which is not conducive to hole tunneling, resulting in a considerable number of holes being distributed in the quantum wells of the electron blocking layer.
On the other hand, because the refractive index of InGaN or GaN material is similar to that of the active layer, it will cause a low optical confinement factor in the waveguide structure, which is not conducive to the confinement of the optical field.

Method used

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  • Nitride light-emitting device for improving light-emitting efficiency by electron barrier layer
  • Nitride light-emitting device for improving light-emitting efficiency by electron barrier layer
  • Nitride light-emitting device for improving light-emitting efficiency by electron barrier layer

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Embodiment 1

[0022] Such as figure 2 As shown, in this embodiment, the nitride light-emitting device adopts a nitride laser, including four parts stacked sequentially from the substrate to the top: a multi-layered N-type electron injection layer 1, an active layer 2, an electron blocking layer 3, and a P-type hole injection layer 4 with a multilayer structure.

[0023] The N-type electron injection layer of multilayer structure includes N-type contact layer, N-type cladding layer and N-type waveguide layer; the active layer includes quantum wells and quantum barriers; the P-type hole injection layer of multilayer structure includes P-type waveguide layer, P-type cladding layer and P-type contact layer.

[0024] The contact layer, cladding layer and waveguide layer can be one of binary system nitrides such as AlN, InN and GaN, or one of ternary system nitrides such as AlGaN, InAlN and InGaN, or even AlInGaN One of the quaternary nitrides.

[0025] Wherein, the electron blocking layer in...

Embodiment 2

[0030] The structure of the light-emitting device is the same as in Embodiment 1, wherein the electron blocking layer includes two layers of AlGaN, and the composition (atomic number) of Al is linearly interpolated and gradually changed, wherein the composition of the first layer of Al is gradually changed from 0 to 0.05, and the composition of the second layer is gradually changed from 0 to 0.05. The composition of Al is gradually changed from 0.06 to 0.35, and the thicknesses of the first layer and the second layer of AlGaN are 5nm and 25nm respectively.

[0031] Each of the three AlGaN layers of the electron blocking layer is P-type uniformly Mg doped.

[0032] Embodiment 2 is an electron blocking layer structure with gradually changing Al composition, and the composition of Al in the two layers from bottom to top is increased by linear interpolation.

[0033] The power-current curves of the light-emitting devices of the prior art, embodiment 1 and embodiment 2 are summariz...

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Abstract

The invention discloses a nitride light-emitting device for improving the light-emitting efficiency by an electron barrier layer. The light-emitting device disclosed by the invention is provided with the electron barrier layer which is doped with aluminum in a non-uniform and non-periodic manner, and has changed Al components. According to the invention, two key problems of improving the light-emitting efficiency are effectively and simultaneously solved, namely a potential barrier of hole tunneling is reduced and the injection efficiency of a hole is improved; and furthermore, parasitic electron inversion layers are prevented from being formed on interfaces of a quantum barrier and the electron barrier layer by a traditional structure. However, the effect on stopping electrons by a multilayer structure is more obvious and two current carriers of the electrons and the hole are distributed in each quantum well of an active layer in a more balanced and uniform way, so as to obtain the more uniform light gain. Therefore, the light-emitting device provided by the invention can effectively overcome a parasitic quantum well phenomenon and has a smaller threshold current. Furthermore, a waveguide structure is provided with a higher optical limiting factor so that a stronger light-emitting strength is obtained; and therefore, the electric performance and the optical performance of a laser device can be simultaneously improved.

Description

technical field [0001] The invention relates to a nitride semiconductor material-based light-emitting device, in particular to a nitride light-emitting device which utilizes an electron blocking layer to improve luminous efficiency. Background technique [0002] The nitride material system (aluminum nitride AlN, gallium nitride GaN and indium nitride InN) is a direct band gap semiconductor, which can form ternary and quaternary solid solution alloys, with a band gap from 0.63eV to 6.4eV, corresponding to the range of luminescence Covering the entire visible light region and extending to the deep ultraviolet and mid-infrared bands, the nitride material system can be used to prepare high-efficiency optoelectronic devices from the mid-infrared light band to the deep ultraviolet, including the entire visible light region. GaN-based light-emitting diodes are the cornerstone of solid-state lighting; nitride lasers are the core devices for next-generation high-density optical stora...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L33/14
Inventor 杨薇胡晓东若比邻李磊
Owner 北京飓芯科技有限公司
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