Preparation method for standard spectral sample and application of standard spectral sample

A technology of spectral standard samples and standard samples, which is applied in the development or production of spectral standard samples and the application field of spectral analysis instruments, can solve the problems of complicated process, difficult to master, low qualified product rate, etc. Simple and easy to master, high rate of qualified products

Inactive Publication Date: 2016-09-07
PANGANG GROUP RESEARCH INSTITUTE CO LTD
View PDF4 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The key step in the development of spectral standard samples is sample preparation. However, the traditional method of sample preparation by smelting and casting has disadvantages such as complicated process, difficult to master, low qualified product rate, long processing cycle, and high production cost, resulting in scarcity and high price of spectral standard samples (spectral standard samples The sample is 10-100 times of the traditional crumb standard sample)
The spectral standard samples required by Panzhihua Iron and Steel Co., Ltd. are mainly outsourced, and less self-developed. The main reason is that the traditional sample preparation methods are difficult to master, so they have to outsource other units to process and prepare samples, which seriously restricts the company's ability to develop spectral standard samples.
Moreover, there are problems such as chemical composition, content, crystal structure and other physical and chemical characteristics of the commercially available standard samples and the actual production varieties are not completely consistent, resulting in a reduction in the calibration effect of the standard samples, and may even be misleading.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Preparation method for standard spectral sample and application of standard spectral sample
  • Preparation method for standard spectral sample and application of standard spectral sample
  • Preparation method for standard spectral sample and application of standard spectral sample

Examples

Experimental program
Comparison scheme
Effect test

preparation example Construction

[0022] The preparation method of spectral standard sample of the present invention comprises the following steps:

[0023] a. Material collection: Cut a piece of raw material on a large finished profile, peel it off, and remove the contamination or oxide layer on the surface of the material;

[0024] b. Cold forging: cold forging the blank material after peeling in step a to obtain a sample that basically meets the requirements of the spectral test;

[0025] c. Post-processing: Peel, polish, and cut the surface of the pattern obtained in step b to obtain a sample that meets the standard spectroscopic test; wherein, the peeling is to remove the surface contamination or oxide layer.

[0026] The preparation method of the spectral standard sample described above, wherein the mass of the blank material in step a is 10-80 kg.

[0027] The preparation method of the above-mentioned spectral standard sample, wherein the large-scale finished profile in step a refers to that the chemic...

Embodiment 1

[0049] Cut a piece of raw material (1# sample) with a mass of 30kg from the finished profile of the PG5 rail; adopt the cold forging method to repeatedly forge from multiple directions at room temperature to form a cylindrical material with a diameter of φ40mm; peel it with a lathe Remove the contamination and oxide layer on the surface of the forged cylindrical material, cut off 4mm from the top and bottom of the cylindrical material after polishing, and then cut it flat into a small columnar sample with a diameter of φ35mm and a height of 50mm.

Embodiment 2

[0051] Cut a blank material (2# sample) with a mass of 80kg from the finished steel hot-rolled plate blank; then heat the blank material to 150°C, and repeatedly forge it from multiple directions by cold forging to form a diameter of φ55mm Use a milling machine to peel off the surface contamination and oxide layer of the forged cylindrical material. After polishing, cut off 5mm from the top and bottom of the cylindrical material, and then cut it flat into a small columnar sample with a diameter of φ50mm and a height of 60mm.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
diameteraaaaaaaaaa
diameteraaaaaaaaaa
diameteraaaaaaaaaa
Login to view more

Abstract

The invention specifically relates to a method for developing or producing a standard spectral sample and application of the standard spectral sample to a spectral analysis instrument, belonging to the technical field of analytical chemistry. The method provided by the invention comprises the following steps: a, material acquisition: cutting off a piece of a blank material from a large finished section and carrying out peeling; b, cold forging and molding: subjecting the peeled blank material obtained in the step a to cold forging so as to obtain a sample meeting requirements of spectral testing; and c, later processing: subjecting the sample obtained in the step b to surface peeling, polishing and cutting so as to obtain the standard sample meeting requirements of spectral testing. The method provided by the invention has the characteristics of easy operation, short preparation flow, good uniformity and qualified rate of products, low cost, capacity of realizing large-batch rapid production, etc., and overcomes the problem of nonuniform segregation in traditional preparation of the standard spectral sample and disadvantages of conventional methods.

Description

technical field [0001] The invention belongs to the technical field of analytical chemistry, and in particular relates to a method for developing or producing a spectral standard sample and its application in a spectral analysis instrument. Background technique [0002] Standard samples are an important material basis and technical condition to ensure product quality control. The market urgently needs all kinds of standard samples for calibrating instruments, calibrating solutions, evaluating test methods, assessing personnel levels, and quality supervision for daily production inspections. In particular, rapid steel-making analyzers, X-ray fluorescence spectroscopy, atomic emission spectroscopy, or photoelectric direct reading spectroscopy and other spectral analysis element composition detection instruments, the equipment status calibration, value transfer traceability, sample type calibration, calibration analysis results, and quality inspection Control and so on need to ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01N1/28G01N21/25G01N21/27G01N21/62G01N23/22G01N23/223
CPCG01N1/286G01N21/25G01N21/274G01N21/62G01N23/2202G01N23/223G01N2201/127
Inventor 成勇张敏袁金红魏芳何其平
Owner PANGANG GROUP RESEARCH INSTITUTE CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap