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Preparation method of ZnS infrared window antireflective microstructure surface

An infrared window and microstructure technology, applied in the field of infrared optical windows, can solve the problems of limited anti-reflection effect, instability, and difficulty, and achieve the effect of symmetrical geometric size, neat arrangement, and overcoming difficult control.

Active Publication Date: 2018-11-16
NORTHWESTERN POLYTECHNICAL UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In the above-mentioned prior art, the laser interference lithography technology used in document ① has strict requirements on the preparation conditions, and the formed laser interference pattern is very sensitive to noise and vibration, so it is unstable, so it is relatively difficult; the method used in document ② Due to the limitation of the diffraction limit, the traditional ultraviolet lithography technology found is difficult to prepare pattern arrays with uniform size distribution and shape in a large area; the self-assembly technology used in literature ③ cannot form periodic arrays with uniform structure sizes; The laser direct writing technology used in literature ④ cannot well control the depth of the prepared microholes, so the anti-reflection effect is limited

Method used

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  • Preparation method of ZnS infrared window antireflective microstructure surface
  • Preparation method of ZnS infrared window antireflective microstructure surface
  • Preparation method of ZnS infrared window antireflective microstructure surface

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0035] (1) ZnS substrate cleaning

[0036] The double-sided polished ZnS substrate was placed in acetone, absolute ethanol, and distilled water for ultrasonic cleaning in order to remove surface pollutants and obtain a ZnS substrate with a clean surface.

[0037] (2) Al film layer deposited on ZnS substrate

[0038] A layer of Al film was deposited on the surface of ZnS by magnetron sputtering. The sputtering process parameters are: Al target, Ar working gas, background vacuum degree better than 6×10 -4 Pa, working pressure 0.5Pa, radio frequency power 90W, argon gas flow rate 15SCCM, coating time 30min; obtain a ZnS substrate coated with an Al film, and the thickness of the Al film is 200nm.

[0039] (3) Ultrafast pulsed laser direct writing microporous structure array in Al film layer

[0040] The laser direct writing process parameters are: pulse laser power 3mW, pulse width 1ps, focusing objective lens multiple 20X, pulse repetition frequency 325Hz / s, sample stage movin...

Embodiment 2

[0046] (1) ZnS substrate cleaning

[0047] The double-sided polished ZnS substrate was placed in acetone, absolute ethanol, and distilled water for ultrasonic cleaning in order to remove surface pollutants and obtain a ZnS substrate with a clean surface.

[0048] (2) Al film layer deposited on ZnS substrate

[0049] A layer of Al film was deposited on the surface of ZnS by magnetron sputtering. The sputtering process parameters are: Al target, Ar working gas, background vacuum degree better than 6×10 -4 Pa, working pressure 0.3Pa, radio frequency power 100W, argon gas flow rate 13SCCM, coating time 20min; obtain a ZnS substrate coated with an Al film, the thickness of the Al film is 150nm.

[0050] (3) Ultrafast pulsed laser direct writing microporous structure array in Al film layer

[0051] The laser direct writing process parameters are: pulse laser power 4mW, pulse width 2ps, focusing objective lens multiple 15X, pulse repetition frequency 334Hz / s, sample stage moving s...

Embodiment 3

[0057] (1) ZnS substrate cleaning

[0058] The double-sided polished ZnS substrate was placed in acetone, absolute ethanol, and distilled water for ultrasonic cleaning in order to remove surface pollutants and obtain a ZnS substrate with a clean surface.

[0059] (2) Al film layer deposited on ZnS substrate

[0060] A layer of Al film was deposited on the surface of ZnS by magnetron sputtering. The sputtering process parameters are: Al target, Ar working gas, background vacuum degree better than 6×10 -4 Pa, working pressure 0.4Pa, radio frequency power 80W, argon gas flow rate 10SCCM, coating time 10min; obtain a ZnS substrate coated with an Al film, the thickness of the Al film is 100nm.

[0061] (3) Ultrafast pulsed laser direct writing microporous structure array in Al film layer

[0062] The laser direct writing process parameters are: pulse laser power 5mW, pulse width 3ps, focusing objective lens multiple 10X, pulse repetition frequency 342Hz / s, sample stage moving sp...

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Abstract

The invention discloses a preparation method of a ZnS infrared window antireflective microstructure surface. The preparation method sequentially comprises the steps of ZnS substrate cleaning, Al filmpreparation / polymer film coating, preparation of a micropore structure array in an Al film or a polymer film, plasma etching and film removal. According to the method, an Al film or a polymer film (PMMA (Polymethyl Methacrylate) or photoresist) is prepared on a ZnS surface firstly, a micropore array is prepared in the film by an ultra-fast pulse laser direct writing technology secondly, and patterns in the film are etched onto the ZnS substrate by a plasma etching technology lastly, so that an antireflective microstructure surface with an antireflective effect can be obtained after film removal. The method has high process stability and high controllability, and micropore arrays which are uniform in geometric sizes and are orderly arranged can be prepared on a large-area substrate.

Description

technical field [0001] The invention relates to the technical field of infrared optical windows, in particular to a method for preparing a ZnS infrared window anti-reflection microstructure surface. Background technique [0002] Zinc sulfide (ZnS) is the most promising infrared optical window material for the 8-12 μm long-wave infrared band, but its refractive index is relatively high, 2.2, the surface reflection is too large, and the final transmittance is only about 74%, which cannot meet the requirements of the application. need. Therefore, surface anti-reflection treatment must be performed on ZnS. Compared with the traditional anti-reflection film, the anti-reflection microstructure surface is directly processed on the surface of the substrate material, and a good optical matching effect can be achieved by adjusting the geometric size of the structure, thereby playing an anti-reflection role. Therefore, the anti-reflection microstructured surface can overcome the prob...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B81C1/00
CPCB81C1/00388B81C1/00404B81C1/00531Y02P70/50
Inventor 李阳平陈勇范思苓林文瑾
Owner NORTHWESTERN POLYTECHNICAL UNIV
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