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Rear light splitting pupil differential confocal LIBS-mass spectrometry microscopic imaging method and device

A differential confocal and microscopic imaging technology, used in measurement devices, analytical materials, thermal excitation analysis, etc., can solve the problems of low spatial resolution of mass spectrometry detection, large laser focusing spot, and long mass spectrometry imaging time. Achieve universality, expand application fields, and improve the effect of spatial resolution

Inactive Publication Date: 2019-01-11
BEIJING INSTITUTE OF TECHNOLOGYGY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] 1) Due to the use of simple laser focusing to desorb and ionize the sample, there are still problems such as large laser focusing spot and low spatial resolution of mass spectrometry detection;
[0006] 2) It is impossible to detect neutral atoms, molecules, neutral ions and groups, etc., which restricts the accurate and complete acquisition of sample component information;
[0007] 3) The time required for mass spectrometry imaging is long, and the axial position of the focused spot of the laser mass spectrometer often drifts relative to the sample to be measured

Method used

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  • Rear light splitting pupil differential confocal LIBS-mass spectrometry microscopic imaging method and device
  • Rear light splitting pupil differential confocal LIBS-mass spectrometry microscopic imaging method and device
  • Rear light splitting pupil differential confocal LIBS-mass spectrometry microscopic imaging method and device

Examples

Experimental program
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Effect test

Embodiment 1

[0046] Such as figure 1 As shown, the collection pupil 11 is placed on the pupil plane of the detection objective lens 13 . The light source system 1 of the excitation beam adopts a point light source, and the excitation beam emitted by the point light source converges on the sample 8 after passing through the collimating lens 2, the compressed focusing spot system 4, the beam splitting prism 5, the dichroic mirror A6 and the measuring objective lens 7 , the computer 34 controls the precise three-dimensional workbench 10 to drive the measured sample 8 to move up and down near the focus of the measuring objective lens 7, and the light reflected by the sample is reflected by the dichroic mirror A6 and reflected by the dichroic prism 5 through the D-type rear pupil 11. The D-type collection pupil 12, the detection objective lens 13, and the relay magnifying lens 14 converge on the two-quadrant detector 16, and the first detection quadrant 17 and the second detection quadrant 18, ...

Embodiment 2

[0055] Such as figure 2 As shown: in the rear split pupil differential confocal LIBS spectrum-mass spectrometer imaging device, the compressed focusing spot system 4 is replaced by a vector beam generation system 35 and a pupil filter 36, and the D-type rear pupil 11 can be replaced by a circular The rear pupil 37 is replaced, and the two-quadrant detector is replaced by a CCD detector 39, wherein the first micro-area of ​​the Airy disk and the second micro-area of ​​the Airy disk detected by the CCD detector are symmetrical about the optical axis.

[0056] All the other are the same as above-mentioned embodiment 1.

Embodiment 3

[0058] Such as image 3 As shown: in the post-divided pupil differential confocal LIBS spectrum-mass spectrometer imaging device, the point light source 1 can be replaced by a pulse laser 40, a condenser lens 41, and a light-transmitting optical fiber 42 at the focus of the condenser lens 41. At the same time, the laser An exit beam attenuator 43 is introduced into the focusing system, and a detection beam attenuator 44 is introduced into the rear split pupil differential confocal detection system. The light intensity adjustment system is composed of the exit beam attenuator 43 and the detection beam attenuator 44, which are used to attenuate the focused spot and the spot intensity detected by the two-quadrant detector 16, so as to meet the light intensity requirement when the sample surface is positioned.

[0059] The remaining imaging methods and processes are the same as in Example 1.

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Abstract

The invention discloses a rear light splitting pupil differential confocal LIBS-mass spectrometry microscopic imaging method and device, and belongs to the technical fields of confocal microscopic imaging, spectral imaging and mass spectrometry imaging measurement. A rear light splitting pupil laser differential confocal microscopic imaging technology is combined with spectrometry and mass spectrometry detection technologies; high-spatial-resolution morphological imaging is carried out on a sample by utilizing a tiny focusing light spot of a rear light splitting pupil differential confocal microscope processed by a super-resolution technology; a mass spectrometry detection system is used for carrying out mass spectrometry detection on electrified molecules, atoms and the like of a micro-region; a spectrometry detection system is used for carrying out micro-region spectrometry detection on an LIBS excited by the focusing light spot; and high-spatial-resolution and high-sensitivity imaging and detection of complete component information and morphological parameters of the micro-region of the sample are achieved by utilizing complementary advantages of laser multi-spectrum detection and structure fusion. A brand new effective technical way can be provided for morphological imaging and substance component detection in the fields of biomedical science, material science, minerals, micro-nano manufacturing and the like.

Description

technical field [0001] The invention belongs to the field of confocal microscopic imaging technology, spectral imaging technology and mass spectrometry imaging technology, and combines rear split pupil differential confocal micro imaging technology, laser induced breakdown spectral imaging technology and mass spectrometry imaging technology, and relates to a rear split pupil The differential confocal LIBS spectrum-mass spectrometer imaging method and device have broad application prospects in the fields of biomedicine, materials science, physical chemistry, minerals, and micro-nano manufacturing. technical background [0002] Mass Spectrometry (Mass Spectrometry) is to ionize the components in the sample, so that the generated charged atoms, molecules or molecular fragments with different charge-to-mass ratios are respectively focused under the action of an electric field and a magnetic field to obtain a sequence of mass-to-charge ratios. Spectrograph instrument. Mass spect...

Claims

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Application Information

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IPC IPC(8): G01N27/64G01N21/71G01N21/01
CPCG01N27/64G01N21/01G01N21/71G01N21/718
Inventor 赵维谦邱丽荣王允
Owner BEIJING INSTITUTE OF TECHNOLOGYGY
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