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SiC substrate double-pulse femtosecond laser slicing method

A technology of femtosecond laser and femtosecond laser, which is applied in laser welding equipment, welding/welding/cutting items, manufacturing tools, etc., can solve the problems of large slice damage thickness, large wafer peeling force, and long processing time, etc. The effect of small damage layer thickness, avoiding a lot of waste, and shortening processing time

Pending Publication Date: 2022-05-10
ZHEJIANG UNIV HANGZHOU GLOBAL SCI & TECH INNOVATION CENT +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The purpose of the present invention is to solve the problems of large material loss, long processing time, high cost and serious environmental pollution in the traditional slicing method; Due to defects such as excessive height and excessive slice damage thickness, a method for stripping SiC substrate double-pulse femtosecond laser slices combined with a "heating-cooling" process is proposed. After cutting with low-energy femtosecond laser double pulses, "fast heating "Cold-stripping" method to generate sufficient internal stress, further destroy the amorphous structure after laser cutting, and reduce the required external peeling mechanical stress

Method used

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  • SiC substrate double-pulse femtosecond laser slicing method
  • SiC substrate double-pulse femtosecond laser slicing method
  • SiC substrate double-pulse femtosecond laser slicing method

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Embodiment

[0035] This embodiment provides a method for double-pulse femtosecond laser slicing of SiC substrates, including the following steps:

[0036] 1) Put the SiC wafer in alcohol for ultrasonic cleaning, remove the surface stains, then dry it, and finally fix it on the laser processing table;

[0037] 2) Adjust the parameters of the femtosecond laser, adjust the parameters to a wavelength of 780nm, a pulse width of 130fs, a pulse energy of 30μJ, a repetition rate of 10kHz, and set the moving speed of the laser processing table to 2mm / s;

[0038] 3) A double-pulse laser is produced by using a double-pulse laser optical circuit device; firstly, a half-wave plate and a polarization beam splitter are used to convert the linearly polarized laser pulse into s- and p-polarized pulses with the same energy; the two pulsed optical paths are introduced into different By precisely controlling the distance traveled by the two optical paths, let them form an optical path difference of 5 ps, and...

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Abstract

The invention discloses a SiC substrate double-pulse femtosecond laser slicing and stripping method, which comprises the following steps of: after low-energy femtosecond laser double-pulse cutting, generating enough internal stress by adopting a'fast heating and cooling-stripping 'method, further destroying an amorphous structure after laser cutting, and reducing the size of required mechanical stress for external stripping. Through a double-pulse laser slicing means, the thickness of a damaged layer caused in the laser slicing process is greatly reduced, and a large amount of waste of materials is avoided; meanwhile, by means of'fast heating and cooling ', the external tension required by stripping after slicing is greatly reduced, so that the slices can be easily stripped; the method is low in material loss, short in processing time, low in cost and low in environmental pollution.

Description

technical field [0001] The invention belongs to the technical field of semiconductors and relates to cutting of silicon carbide, in particular to a method for slicing a SiC substrate with a double-pulse femtosecond laser. Background technique [0002] With the development of science and technology, people have higher and higher requirements for electronic devices, and high temperature, high frequency, radiation resistance and high power have become the most basic requirements. The third-generation semiconductor materials have characteristics such as wider bandgap, higher thermal conductivity, higher radiation resistance, and greater electron saturation drift rate, and have important application values ​​in the fields of optoelectronics and microelectronics. SiC is a typical representative of the third-generation semiconductor, but its hardness is very high, with a Mohs hardness of 9.5, second only to diamond (10), and it is not easy to cut. The existing SiC cutting methods ...

Claims

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Application Information

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IPC IPC(8): B23K26/38B23K26/402B23K26/064B23K26/067
CPCB23K26/38B23K26/402B23K26/064B23K26/0676B23K26/0643B23K26/0648B23K2103/56
Inventor 王蓉许彬杰皮孝东王明华杨德仁
Owner ZHEJIANG UNIV HANGZHOU GLOBAL SCI & TECH INNOVATION CENT
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