Conductive adhesive interconnection with insulating polymer carrier

Abstract

A method and apparatus is provided for forming an electronic assembly whereby an insulating polymer matrix having a plurality of conductor holes is attached to a first substrate wherein the conductor holes align with a corresponding contact array on the first substrate. Subsequently, a flexible, electrically conductive adhesive is provided within the plurality of conductor holes and a solid conductive material, preferably having a high melting temperature, is attached to at least one end thereof. The insulating polymer matrix with the electrically conductive adhesive and the solid conductive material is then cured at a temperature sufficient to completely cure the matrix to completely surround the electrically conductive adhesive, as well as permanently attaching the matrix and conductive adhesive to the first substrate and permanently attaching the solid conductive material to the conductive adhesive. A second substrate may then be attached to the conductive matrix structure secured to the first substrate by providing a low melting temperature attachment means to the solid conductive material attached to the matrix and subsequently reflowing the assembly to form an electronic assembly adapted with the capability of reworkability.

Description

[0001] 1. Field of the Invention[0002] The present invention relates to electronic assemblies, and in particular, to electrically and mechanically connecting two electronic components to form an electronic assembly having reduced thermo-mechanical fatigue, while also providing the electronic assembly with the ability to use existing bond and assembly technologies in addition to providing the assembly with reworkability.[0003] 2. Description of Related Art[0004] Forming electronic assemblies by electrically connecting two components such as a multi-layer ceramic package or circuit chip to a card, board, or another connector is well known in the art. Such multi-layer electronic assembly formation is referred to in the art as surface mount technology which can include, but is not limited to, solder join, flip chip, C4, ball grid array and pin grid array. As will be recognized, surface mount technology has gained acceptance as the preferred means of joining electronic package assemblies...

AI Technical Summary

Benefits of technology

0019] Another object of the invention is to provide improved surface mount technology for use in connecting smaller multi-chip modules having structural stability with greater strain absorption for a more reliable electronic assembly.

0020] Still another object of the present invention is to provide an electronic component...

Problems solved by technology

However, as a result of the interposer comprising a thermoplastic polymer, the interposer is typically made of a high modulus non-compliant material which does not alleviate CTE mismatch induced strain through material movement.

However, such technology relies on strong, typically permanent, bonds between the interposer and both electronic components, and thereby is not compatible with electronic assemblies requiring or desiring the ability of component reworkability.

However, such soldering techniques produce solder bonds of very small height leading to decreased strain absorption capability, as well as costly high temperature reflows as a result of the double reflow operations.

However, these area array technologies are limited by strain absorption due to the allowable diameter of the solder sphere.

During normal operations, the entire module is subject to temperature excursions due to the functioning of the circuits on the chip, resistance heating of the solder joints, the wiring within the chip, and the wiring within the substrate.

This heating results in the expansion and contraction of all of these components as temperatures rise and fall.

ing. This mismatch places stresses on the solder joints, and over time results in the fatigue of the solder jo

ints. Eventually, continual stress causes cracks to propagate completely across the solder joints leading to electrical failure of the electronic m

Furthermore...

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