Cleaning liquid of semiconductor chip after chemical mechanical grind

A chemical-mechanical and post-cleaning technology, applied in the field of cleaning fluid, can solve the problems of reduced wettability and achieve the effects of reducing sedimentation, improving cleaning efficiency, and increasing roughness

Inactive Publication Date: 2009-10-14
杭州月旭科学仪器有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In order to achieve better chip performance, with the increasing application of Low K materials as media in chip processing, new challenges have arisen for cleaning fluids after chemical mechanical polishing of copper. Most Low K materials are hydrophobic, similar to carbon dioxide Compared with silicon, the wettability is greatly reduced, and the traditional water-based cleaning solution after chemical mechanical polishing cannot clean the Low K material well.

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0025] Take 100 grams of water, 0.5 grams of acetic acid, 0.01 grams of phosphate, Rohm and Haas company 0.005 g of CG insecticide, 0.5 g of gallic acid, and 0.05 g of alkyl glucoside are mixed, and the pH is adjusted to 4 with nitric acid and ammonia water to obtain a diluted semiconductor chip cleaning solution after chemical mechanical grinding of the present invention.

Embodiment 2

[0027] Get 5 grams of water, 0.5 grams of acetic acid, 0.01 grams of phosphate, 0.005 grams of insecticides, 0.5 grams of gallic acid, and 0.05 grams of alkyl glucosides, mix them, adjust the pH to 3.5-4 with nitric acid and ammonia water, and obtain a concentrated Cleaning solution after chemical mechanical polishing of state semiconductor chips.

Embodiment 3

[0029] Take 100 grams of water, 1 gram of malic acid, 0.05 gram of pyrophosphate, 0.01 gram of insecticide, 0.01 gram of hydroquinone, and 0.1 gram of ethylene glycol silane oil, adjust the pH to 4-4.5 with hydrochloric acid and ammonia water, and obtain this product The invention discloses a cleaning solution after chemical mechanical polishing of a diluted semiconductor chip.

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PUM

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Abstract

A kind of cleaning solution for semiconductor chip after chemo-mechanical grind. Contents of it are as follow, water, 100 part by weight; chelator, 0.01-4 part by weight; brightener, 0.001-2 part by weight; conserving agent,0.0005-0.1 part by weight; buffering agent,0.001-4 part by weight; surface active agent,0.001-1 part by weight. And pH is 1-7.

Description

technical field [0001] The invention relates to a cleaning liquid, in particular to a cleaning liquid for cleaning the chip after the copper chemical mechanical polishing process in the semiconductor chip processing and manufacturing process. Background technique [0002] With the design of semiconductor chips becoming smaller and smaller, copper materials are widely used as chip wire materials in the design standards of 0.13 μm and below because of their good electrical conductivity and good electron migration resistance. Since copper cannot form volatile compounds, it is easy to form copper interconnection wires and through-hole wires on the surface of silicon wafers. During the manufacturing process of semiconductor chips, chemical mechanical grinding technology must be used to remove them. In summary, the copper chemical mechanical polishing process is to polish the surface of the silicon wafer in contact with the polishing pad, using the abrasive as a lubricant. Abrasi...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): C23G1/06H01L21/302H01L21/461
Inventor 姚立新
Owner 杭州月旭科学仪器有限公司
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