Sputtering, depositing split cavity type vacuum film deposition apparatus and working method thereof
A technology of vacuum thin film and deposition device, applied in sputtering coating, vacuum evaporation coating, ion implantation coating and other directions, can solve the problems of large pressure difference, easy deformation, unsuitable for sputtering deposition, etc., to prevent pollution, Conducive to contact and improve the effect of parameter controllability
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Embodiment 1
[0014] Embodiment 1: the sputtering source 2 selects the high-energy electron beam source, the vacuum atmosphere of the sputtering chamber 18 is air (or oxygen or nitrogen or argon or other gases), and the atmosphere of the deposition chamber 19 is air of different pressures and different types. Now it is oxygen (or nitrogen or argon or other gases). The high-energy electron beam bombards the target 3 to generate a sputtering product 4—plasma plume. The plume reaches the substrate 9 through the through hole 5 on the hemispherical isolation plate 6, and nucleates and grows on the substrate 9 to form a thin film. Simultaneously can be installed in the sputtering chamber 18 as other auxiliary devices such as enhanced charge-coupled device (ICCD), be used for studying the composition and other kinetic behaviors of plume; ) and so on to study the behavior of thin film deposition process.
Embodiment 2
[0015] Embodiment 2: the sputtering source 2 selects the pulse laser light source for use, the vacuum atmosphere of the sputtering chamber 18 is air (or oxygen or nitrogen or argon or other gases), and the atmosphere of the deposition chamber 19 is air of different pressures and different types. Oxygen (or nitrogen or argon or other gases). The laser irradiates the target material 3 to generate a sputtering product 4—plasma plume. The plume reaches the substrate 9 through the through hole 5 on the hemispherical isolation plate 6, and nucleates and grows on the substrate 9 to form a thin film. Simultaneously can be installed in the sputtering chamber 18 as other auxiliary devices such as enhanced charge-coupled device (ICCD), be used for studying the composition and other kinetic behaviors of plume; ) and so on to study the behavior of thin film deposition process.
Embodiment 3
[0016] Embodiment 3: the sputtering source 2 selects the ion beam source, the vacuum atmosphere of the sputtering chamber 18 is air (or oxygen or nitrogen or argon or other gases), and the atmosphere of the deposition chamber 19 is different pressures and different types of air. Now Oxygen (or nitrogen or argon or other gases). The ion beam bombards the target material 3 to produce sputtering products 4, which reach the substrate 9 through the through holes 5 on the hemispherical isolation plate 6, and nucleate and grow on the substrate 9 to form a thin film. At the same time, other auxiliary devices such as a secondary ion mass spectrometer (SIMS) can be installed in the sputtering chamber 18 to study the composition changes of secondary ions; researches such as a high energy electron diffraction device (RHEED) can also be installed in the deposition chamber 19. Behavior during thin film deposition.
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