Bidirectional observation and full spectrum direct reading light path system for spectrograph

An optical path system and spectrometer technology, applied in the field of spectroscopy, can solve problems such as reducing signal-to-background ratio, low detection limit and background intensity, and measurement accuracy limitations, and achieve the effects of small size, improved resolution, and improved image quality

Inactive Publication Date: 2012-04-18
JIANGSU SKYRAY INSTR
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Problems solved by technology

In the plasma emission spectrum, the intensity of the emitted signal mainly depends on the length of the light source channel, while the radial observation is limited by the height of the slit, the length of the light source channel is much more limited than the axial observation, resulting in the detection limit Compared with axial observation, it is several times higher. At the same time, when radial observation is used, the detector inevitably receives a strong radiation background in the annular area, which reduces the signal-to-background ratio during measurement.
Horizontal observation can accept relatively strong emission signals, guarantee lower detection limit and background intensity (that is, the background equivalent concentration is relatively small), and has the advantages of higher signal-to-background ratio and lower detection limit, but due to the horizontal The intensity of observation light increases by an order of magnitude, and when measuring high-content elements, only sub-sensitive lines can be selected, which limits the measurement accuracy

Method used

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  • Bidirectional observation and full spectrum direct reading light path system for spectrograph
  • Bidirectional observation and full spectrum direct reading light path system for spectrograph

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0027] The horizontal two-way observation optical path system images the target 11 on the slit 4, and realizes the switching of axial and radial observation through the rotation of the plane mirror 1. The slit 4 is located on the focal plane of the spherical collimating mirror 6, and the light passing through the slit 4 After being dispersed by the refracting prism 7 in the horizontal direction, it is dispersed in the vertical direction by the echelle grating 8, and the light dispersed by the echelle grating 8 is dispersed in the horizontal direction by the prism 7 again. When it shines on the spherical focusing mirror 9 , the focal plane detector 10 is located on the focal plane of the focusing mirror 9 , and the light passing through the focusing mirror forms a two-dimensional full spectrum on the target surface of the focal plane detector 10 . Image acquisition control and signal processing adopt microcomputer system.

Embodiment 2

[0029] The optical path structure of two-way observation and full-spectrum direct reading is built in the inductively coupled plasma emission spectrometer, and the sample is sampled, which is a mixed solution containing Na element.

[0030] After ignition and sample injection, the plasma flame is placed horizontally. In this example, the light is collected from the radial direction, and the light in the radial direction is irradiated on the plane mirror 1, and the light in the radial direction is irradiated on the axial spherical mirror 2 through the plane mirror 1, and then passed through the radial spherical mirror 2. After projecting to the turning mirror 3, the light in the radial direction is imaged on the slit 4 by rotating the turning mirror 3, and the light emitted from the slit 4 passes through the spherical collimating mirror 6, refracts through the refracting prism 7, and then reaches the echelle grating 8 , the light diffracted by the echelle grating 8 is dispersed ...

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Abstract

The invention discloses a bidirectional observation and full spectrum direct reading light path system for a spectrograph. The light path system comprises a bidirectional observation front lighting system and a crossed dispersion main light path system, wherein the bidirectional observation front lighting system is located in the horizontal direction, the crossed dispersion main light path system is located in the vertical direction, and two systems form a T-shaped structure; the bidirectional observation front lighting system is used for imaging a target on a slit and light rays from the front lighting system enter the crossed dispersion main light path system through the slit to obtain a two-dimensional spectrograph which is received by a plane array detector, so that full spectrum direct reading is realized. The bidirectional observation and full spectrum direct reading light path system for the spectrograph has the following characteristics that: the bidirectional observation front lighting system and the vertical crossed dispersion main light path system form the T-shaped structure, so that the structure is compact and the space is saved; by adoption of the vertical light path, the dispersion main light path system is capable of improving coma aberration and astigmatism favorably, increasing imaging quality, improving resolution, dispensing with any moving component and reducing loss of elements; and the light path system disclosed by the invention has the advantages of few simple optical elements, no special aspherical mirror, easy processing and low cost.

Description

[0001] technical field [0002] The invention belongs to the technical field of spectroscopy, in particular to an échelle grating spectrometer with high resolution and fast testing speed, and in particular to a two-way observation full-spectrum direct-reading optical path system for the spectrometer. [0003] Background technique [0004] The echelle spectrometer is a spectral analysis instrument. Compared with the traditional single-channel scanning spectrometer, the echelle spectrometer has the advantages of low detection limit, wide band, no moving parts in the monochromator, compact structure, and can be realized without multiple scanning exposures. The characteristics of transient measurement of multi-element spectroscopy are conducive to the realization of high intelligence and automation, which represents the development trend of spectroscopy technology. [0005] The former optical system widely adopts Czerney-Turner (CT) structure structure, and the dispersion eleme...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/18G01N21/01
Inventor 刘召贵黄冲陈祖新毛秦军朱小琴
Owner JIANGSU SKYRAY INSTR
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