Bidirectional observation and full spectrum direct reading light path system for spectrograph

Abstract

The invention discloses a bidirectional observation and full spectrum direct reading light path system for a spectrograph. The light path system comprises a bidirectional observation front lighting system and a crossed dispersion main light path system, wherein the bidirectional observation front lighting system is located in the horizontal direction, the crossed dispersion main light path system is located in the vertical direction, and two systems form a T-shaped structure; the bidirectional observation front lighting system is used for imaging a target on a slit and light rays from the front lighting system enter the crossed dispersion main light path system through the slit to obtain a two-dimensional spectrograph which is received by a plane array detector, so that full spectrum direct reading is realized. The bidirectional observation and full spectrum direct reading light path system for the spectrograph has the following characteristics that: the bidirectional observation front lighting system and the vertical crossed dispersion main light path system form the T-shaped structure, so that the structure is compact and the space is saved; by adoption of the vertical light path, the dispersion main light path system is capable of improving coma aberration and astigmatism favorably, increasing imaging quality, improving resolution, dispensing with any moving component and reducing loss of elements; and the light path system disclosed by the invention has the advantages of few simple optical elements, no special aspherical mirror, easy processing and low cost.

Description

[0001] technical field [0002] The invention belongs to the technical field of spectroscopy, in particular to an échelle grating spectrometer with high resolution and fast testing speed, and in particular to a two-way observation full-spectrum direct-reading optical path system for the spectrometer. [0003] Background technique [0004] The echelle spectrometer is a spectral analysis instrument. Compared with the traditional single-channel scanning spectrometer, the echelle spectrometer has the advantages of low detection limit, wide band, no moving parts in the monochromator, compact structure, and can be realized without multiple scanning exposures. The characteristics of transient measurement of multi-element spectroscopy are conducive to the realization of high intelligence and automation, which represents the development trend of spectroscopy technology. [0005] The former optical system widely adopts Czerney-Turner (CT) structure structure, and the dispersion eleme...

AI Technical Summary

Problems solved by technology

In the plasma emission spectrum, the intensity of the emitted signal mainly depends on the length of the light source channel, while the radial observation is limited by the height of the slit, the length of the light source channel is much more limited than the axial observation, resulting in the detection limit Compared with axial observation, it is several times higher. At the same time, when radial observation is used, the detector inevitably receives a strong radiation background in the annular area, which reduces the signal-to-background ratio during measurement.

Horizontal observation can accept relatively strong emission signals, guarantee lower detection limit and background intensity (that is, the background equivalent concentration is relatively small), and has the advantages of higher signal-to-background ratio and lower detection limit, but due to the horizontal The intensity of observation light increases by an order of magnitude, and when measuring high-content elements, only sub-sensitive lines can be selected, which limits the measurement accuracy

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