High-temperature-resistance compound medium isolating method of aluminum base film temperature sensor

A thin-film temperature and composite medium technology, which is applied in the field of high-temperature-resistant composite medium isolation of aluminum-based thin-film temperature sensors, can solve the problems of sensitive line interruption, line erosion, and etching solution accumulation, etc., and achieve simple manufacturing process and substrate integration. High force, good insulation performance

Inactive Publication Date: 2012-07-11
HARBIN ENG UNIV
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Problems solved by technology

On the one hand, holes and defects on the surface of the anodized film affect the continuity of the metal film on the surface, and even cause discontinuity of sensitive lines;
If wet etching is used, it is easy to cause th

Method used

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  • High-temperature-resistance compound medium isolating method of aluminum base film temperature sensor
  • High-temperature-resistance compound medium isolating method of aluminum base film temperature sensor
  • High-temperature-resistance compound medium isolating method of aluminum base film temperature sensor

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[0018] Technical means of the present invention mainly comprises:

[0019] Select industrial pure aluminum as the raw material, and process the sample size according to the requirements.

[0020] The aforementioned samples were subjected to pretreatment processes such as sandpaper grinding and electrochemical polishing.

[0021] The aforementioned pretreated samples were placed in an aqueous electrolyte solution doped with rare earth element additives for insulating anodic oxidation.

[0022] The aforementioned anodized samples were sealed at high temperature for 30 minutes in a sealing solution containing rare earth elements, and then dried naturally.

[0023] The aforementioned surface of the oxide film after hole sealing is subject to mechanical polishing.

[0024] The oxide film surface of the aforementioned loose layer is removed, and a layer of Al is prepared by electron beam evaporation. 2 o 3 membrane.

[0025] The following examples describe the present invention...

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Abstract

The invention provides a high-temperature-resistance compound medium isolating method of an aluminum base film temperature sensor. The method comprises the following steps: processing aluminum into a sensor substrate; performing polishing and electric chemical polishing pretreatment on the sensor substrate; placing the sensor substrate into an electrolyte aqueous solution containing a rare-earth element additive and performing the insulated anodizing; performing high-temperature hole-sealing treatment for 30min in sealing liquid containing rare-earth elements, and the naturally drying; mechanically polishing the surface of a sealed oxidation film; and preparing an Al2O3 layer according to an electronic beam evaporation method. Compared with a medium isolated layer obtained according to the traditional technology, the medium isolated layer obtained according to the method provided by the invention has the advantages of high substrate binding force, excellent insulating property, no cracking under the condition of 550 DEG C high-temperature thermal treatment; and moreover, the manufacturing process is simple and easy to implement.

Description

technical field [0001] The invention relates to a processing method for electronic components. Specifically, it is a high-temperature-resistant composite dielectric isolation method for an aluminum-based film temperature sensor. Background technique [0002] The traditional thin film temperature sensor realizes dielectric isolation mostly by directly using Al 2 o 3 , SiO 2 ceramics as substrates. If conductive ceramics or conductive metals are used as the substrate, a layer of dielectric isolation layer needs to be sputtered on the surface by PVD or CVD. Although the isolation method directly using the insulating medium as the substrate has good insulation performance, it has the characteristics of difficult substrate processing and poor mechanical properties. The method of sputtering a dielectric isolation film on the surface of a conductive metal or ceramic by external force has the disadvantages of poor insulation performance, easy breakdown, and poor film-substrate ...

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Application Information

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IPC IPC(8): C23C28/02C25D11/10C25D11/18C23C14/08C23C14/30
Inventor 乔英杰崔新芳张晓红
Owner HARBIN ENG UNIV
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