Preparation method of group III nitride substrate

A nitride and substrate technology, applied in the field of preparation of III-nitride substrates, can solve the problems of cumbersome process, difficult graphene, poor quality, etc., and achieve the effects of high crystal quality, low defect density, and low stress

Inactive Publication Date: 2017-06-13
苏州瑞而美光电科技有限公司
View PDF12 Cites 16 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] 1. Graphene prepared by chemical vapor deposition or graphite redox method is mostly discontinuous and of poor quality, and it is difficult to grow a seed layer of high-quality crystal quality on its surface
[0006] 2. It is very difficult to peel off graphene from the substrate, and it is easy to cause graphene wrinkles and introduce impurities
[0007] 3. The process is cumbersome, it must be stripped first, and then transferred

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Preparation method of group III nitride substrate
  • Preparation method of group III nitride substrate

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0031] like figure 1 , 2 As shown, the preparation method of the present invention comprises the following steps:

[0032] (1) Select a silicon carbide (SiC) substrate 1 as the substrate, and epitaxially multi-layer graphene on the carbon surface or silicon surface of the silicon carbide (SiC) substrate 1 by means of SiC epitaxial thermal decomposition, and the silicon carbide (SiC) substrate 1 During the epitaxial thermal decomposition process, the Si-C bond is opened, and the Si atoms begin to sublime. After the sublimation of the Si atoms on the epitaxial surface, the C-C bond is reconstructed, and finally 3 to 9 graphene layers are formed. Ar / H2 mixed gas was introduced as carrier gas, heated to 850~1650℃ by RF radio frequency, and the vacuum degree was kept at 10 during the process. -6 ~10 -8 Torr.

[0033] The crystal structure of the silicon carbide (SiC) substrate 2 is 4H-SiC or 6H-SiC or 3C-SiC, and the conductivity type is semi-insulating type or N-type conductiv...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
thicknessaaaaaaaaaa
Login to view more

Abstract

The invention discloses a preparation method of a group III nitride substrate. The preparation method comprises the following steps: selecting a silicon carbide substrate as a matrix, at certain vacuum degree, heating a SiC substrate to 1400-1650 DEG C through RF (radio frequency), introducing Ar/H2 mixed gas as a carrier gas in an epitaxy thermal decomposition process, and epitaxially growing multiple graphene layers on a carbon surface or a silicon surface of the SiC substrate; depositing and growing a group III nitride nucleating layer on the surface of multiple graphene layers; growing thick-layer group III nitride on the surface of the group III nitride nucleating layer; stripping the SiC matrix by adopting a mechanical stripping method, and grinding and polishing the surface of a group III nitride slice with the SiC matrix stripped, so as to obtain the group III nitride substrate. Multiple graphene layers which are large in area and high in quality can epitaxially grow on the carbon surface or silicon surface of the SiC substrate, and a high-quality group III nitride nucleating layer grows. The obtained nitride substrate slice is small in stress, low in defect density and high in crystal quality.

Description

technical field [0001] The invention belongs to the technical field of preparation of third-generation semiconductor substrate materials, and relates to a preparation method of a group III nitride substrate, in particular to a preparation method of a group III nitride substrate with low defect density and high crystal quality. Background technique [0002] In recent years, the third-generation semiconductor materials represented by aluminum nitride, gallium nitride and indium nitride have received more and more attention from the industry. As the representative materials of the third-generation semiconductor, nitrides such as aluminum nitride The material has excellent electrical and optical properties, and at the same time has the advantages of wider band gap and direct band gap, and can form a two-dimensional electron gas with high concentration and high mobility, which makes up for the large effective mass and low mobility of wide-bandgap semiconductor electrons. The mate...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): C30B25/18C30B29/02C30B29/38C30B29/40H01L21/02
CPCC30B25/183C30B29/02C30B29/38C30B29/403C30B29/406H01L21/02378H01L21/02444H01L21/02458H01L21/0254
Inventor 王峰
Owner 苏州瑞而美光电科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products