Double-sided power generation solar cell and preparation method thereof
A solar cell, double-sided technology, used in photovoltaic power generation, circuits, electrical components, etc., can solve the problems of incomplete etching of aluminum paste, large damage to solar cells, large amount of aluminum paste, etc., and achieve passivation on the back of etching. The effect of uniform film, improving photoelectric conversion efficiency and saving energy
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Embodiment 1
[0055] The preparation method of the partial aluminum back field solar cell is as follows:
[0056] S1: Select 156×156mm P-type silicon, form a textured surface on the front side of the silicon wafer, use wet or dry etching technology to form a textured surface on the surface of the P-type silicon wafer, and control the reflectivity at 20%.
[0057] S2: Phosphorus is diffused on the front side of the silicon wafer treated in S1 to form an N-type emitter. The N-type emitter can be formed by thermal diffusion or ion implantation, wherein the diffusion of the silicon wafer is preferably made of phosphorus oxychloride , it is necessary to control the sheet resistance at 90ohm / sq during diffusion.
[0058] S3: On the basis of S2, the device removes the phosphosilicate glass formed during the diffusion process, and uses HF solution to remove the phosphosilicate glass layer formed during the diffusion process on the front of the N-type emitter and the back of the P-type silicon wafer...
Embodiment 2
[0065] S1: Select 156×156mm P-type silicon, form a textured surface on the front side of the silicon wafer, use wet or dry etching technology to form a textured surface on the surface of the P-type silicon wafer, and control the reflectivity at 10%.
[0066] S2: Phosphorus is diffused on the front side of the silicon wafer treated in S1 to form an N-type emitter. The N-type emitter can be formed by thermal diffusion or ion implantation, wherein the diffusion of the silicon wafer is preferably made of phosphorus oxychloride , it is necessary to control the sheet resistance at 75ohm / sq during diffusion.
[0067] S3: On the basis of S2, the device removes the phosphosilicate glass formed during the diffusion process, and uses HF solution to remove the phosphosilicate glass layer formed during the diffusion process on the front of the N-type emitter and the back of the P-type silicon wafer.
[0068] S4: Use PVECD equipment to first deposit 8nm aluminum oxide or silicon dioxide on ...
Embodiment 3
[0074] S1: Select 156×156mm P-type silicon, form a textured surface on the front side of the silicon wafer, use wet or dry etching technology to form a textured surface on the surface of the P-type silicon wafer, and control the reflectivity at 30%.
[0075] S2: Phosphorus is diffused on the front side of the silicon wafer treated in S1 to form an N-type emitter. The N-type emitter can be formed by thermal diffusion or ion implantation, wherein the diffusion of the silicon wafer is preferably made of phosphorus oxychloride , it is necessary to control the sheet resistance at 75ohm / sq during diffusion.
[0076] S3: On the basis of S2, the device removes the phosphosilicate glass formed during the diffusion process, and uses HF solution to remove the phosphosilicate glass layer formed during the diffusion process on the front of the N-type emitter and the back of the P-type silicon wafer.
[0077] S4: Use PVECD equipment to first deposit 8nm aluminum oxide or silicon dioxide on ...
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