Silicon carbide composite substrate for preparing nitride single crystal film

A technology of silicon carbide substrate and composite substrate, which is applied in the direction of single crystal growth, single crystal growth, crystal growth, etc. Thin and other problems, to shorten the production cycle, improve quality, reduce the effect of scrap rate

Pending Publication Date: 2022-05-03
浙江富芯微电子科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, due to factors such as the grinding pressure of the grinding machine, the grinding speed, the concentration of the polishing solution, and the pH value, the silicon carbide substrate obtained by this process is often not smooth enough, which affects the quality of the nitride single crystal film.
In addition, the physical grinding process will also lead to thinning of the silicon carbide substrate, especially for reprocessed products, the thinner and thinner the substrate, the thinner the substrate will increase the difficulty of post-processing

Method used

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  • Silicon carbide composite substrate for preparing nitride single crystal film

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0037] First, the silicon carbide substrate is plasma cleaned. A mixture of hydrogen and nitrogen is introduced into the cleaning chamber, the flow ratio of hydrogen and nitrogen is 3:1; the microwave power is 800w; the cleaning temperature is 1000°C; the cleaning time is 60 minutes.

[0038] Put the cleaned silicon carbide substrate on the lifting platform in the reaction chamber, and adjust the height of the lifting platform so that the distance between the highest point on the upper surface of the silicon carbide substrate and the top wall of the reaction chamber is 5 μm. Then, evacuate to a pressure of 1*10 in the reaction chamber -6 After Pa, feed SiO gas and N at a flow ratio of 3:2 2 , when p(O 2 ) / pθ=10 -19 , p(SiO) / pθ=6.0*10 1.0 , that is, when the SiO partial pressure p(SiO)=6.0MPa (where p(O 2 ) is the partial pressure of oxygen, pθ is the standard atmospheric pressure), stop feeding SiO gas and nitrogen, and then heat the silicon carbide substrate to 2000°C to c...

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PUM

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Abstract

The invention relates to a silicon carbide composite substrate for preparing a nitride single crystal film, which is characterized in that a silicon nitride layer with a flat upper surface is arranged on the surface of the silicon carbide substrate, so that the uneven surface of the silicon carbide substrate is well leveled, and the surface of the substrate becomes smooth and flat; and epitaxial growth of a high-quality nitride single crystal film in the later period is facilitated. In addition, the silicon carbide substrate does not need to be thinned, is large in thickness, and facilitates processing of a later process, so that the quality of the whole finished product is further improved, the yield of the whole production process is improved, the rejection rate is reduced, and the production cost is saved.

Description

technical field [0001] The invention relates to the technical field of silicon carbide new materials, in particular to a silicon carbide composite substrate for preparing a nitride single crystal thin film. Background technique [0002] Silicon carbide, as a semiconductor material used in light-emitting device transistors and semiconductor devices, has a larger band gap than commonly used single crystal silicon. In addition, the silicon carbide substrate has better lattice matching with the nitride semiconductor. These characteristics make nitride semiconductor materials made of silicon carbide substrates have the advantages of high breakdown voltage, good thermal conductivity, and low on-resistance, and have broad market application prospects. [0003] In order to produce high-quality nitride single crystal thin films, silicon carbide substrates with good physical properties and smooth appearance are required. In the prior art, a silicon carbide substrate with a smooth an...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/02C30B25/02C30B29/38
CPCH01L21/02378H01L21/0254H01L21/02598H01L21/0262H01L21/02664C30B29/38C30B25/02
Inventor 徐良余雅俊占俊杰陈素春孟秀清阳明益林骞
Owner 浙江富芯微电子科技有限公司
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