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Self-supported nitride semiconductor substrate and its production method, and light-emitting nitride semiconductor device using it

A technology of nitride semiconductors and manufacturing methods, which is applied in semiconductor/solid-state device manufacturing, semiconductor devices, chemical instruments and methods, etc., can solve problems such as the orientation deviation of nitride semiconductor crystals, and achieve the effect of improving characteristics

Active Publication Date: 2011-05-04
SUMITOMO CHEM CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, the crystal lattice plane of this nitride semiconductor layer fusion film is not completely parallel to the substrate (not completely flat), and the crystal orientation of the nitride semiconductor is slightly deviated.

Method used

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  • Self-supported nitride semiconductor substrate and its production method, and light-emitting nitride semiconductor device using it
  • Self-supported nitride semiconductor substrate and its production method, and light-emitting nitride semiconductor device using it
  • Self-supported nitride semiconductor substrate and its production method, and light-emitting nitride semiconductor device using it

Examples

Experimental program
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Effect test

reference example 1

[0036] Even GaN substrates with a small X-ray diffraction half-amplitude on {0002} symmetrical diffraction planes have low luminous luminance of light-emitting diodes (LEDs) using them. substrate formation figure 2 LEDs shown.

[0037] The manufacturing method of the GaN self-supporting substrate of each sample is as follows. After forming a GaN buffer layer and a GaN layer on a 2-inch-diameter sapphire substrate, the sapphire substrate and GaN buffer layer were removed. Both surfaces of the obtained GaN substrate were polished to produce a GaN self-supporting substrate with a thickness of 270 μm. Manufacturing conditions such as heating temperature were changed for each sample to form a GaN buffer layer and a GaN layer.

[0038] The structure of the LED formed on each GaN self-supporting substrate is the same as in Example 8 below. Table 1 shows the relationship between the X-ray diffraction half-width of the {0002} plane of the GaN self-supporting substrates of Samples ...

Embodiment 1

[0042] In the tubular reaction vessel made of quartz provided with a halogen gas supply pipe and a N source supply pipe, a quartz boat containing Ga metal is provided at a position close to the halogen gas supply pipe, and at a position away from the quartz boat and close to For the position of the N source supply pipe, the sapphire base substrate 1 with a diameter of 2 inches perpendicular to the reaction pipe is fixedly arranged on the support.

[0043] While heating the quartz boat containing Ga metal to 900°C, heat the sapphire base substrate 1 to 510°C. In this state, the carrier gas hydrogen and HCl gas are introduced into the tubular reaction vessel from the halogen gas tube, and the tube is supplied from the N source. Supply nitrogen and ammonia as carrier gases. HCl gas reacts with Ga to form GaCl. According to GaCl and NH 3 reaction, a buffer layer made of GaN was grown with a film thickness of 30 nm on the sapphire underlying substrate 1 .

[0044] Raise the temp...

Embodiment 2

[0054] A GaN self-supporting substrate was produced in the same manner as in Example 1 except that a GaAs underlying substrate was used instead of a sapphire underlying substrate. The X-ray diffraction half-amplitudes of the {20-24} plane and the {11-24} plane of GaN are 322 seconds and 336 seconds, respectively, and it is confirmed that although it is slightly inferior to Example 1, it has relatively good crystallinity.

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Abstract

The invention provides a nitride semiconductor free-standing substrate for preparing a luminescent element exhibiting a high luminescent power at a low driving voltage. The nitride semiconductor free-standing substrate, which has a diameter of at least 10 mm and of which the X-ray diffraction half width of at least either of a (20-24) diffraction plane and a (11-24) diffraction plane is 500 sec or less, can be produced by (1) forming a first nitride semiconductor layer with a dislocation density of 10<n> / cm<2> (0<n<=10) on a base substrate, (2) forming a mask layer composed of a material other than a nitride semiconductor on the first nitride semiconductor layer, (3) forming, in the mask layer, an opening section having an opening area of 10<-n>cm<2> or less, penetrating in a membrane thickness direction, and with a density of 10<n-2> / cm<2>, (4) forming a second nitride semiconductor layer with a thickness of 50 mu m or more on the mask layer, and (5) removing the base substrate to the mask layer.

Description

technical field [0001] The present invention relates to a nitride semiconductor self-supporting substrate used for a light-emitting device or the like that obtains high luminous output at a low driving voltage, a method for manufacturing the same, and a nitride semiconductor light-emitting device using the nitride semiconductor self-supporting substrate. Background technique [0002] It is generally difficult to grow nitride semiconductors from molten liquid in bulk. Therefore, after growing nitride semiconductor layers on different types of underlying substrates such as sapphire substrates or gallium arsenide, the underlying substrates are removed and only the nitride semiconductor layers are left to obtain self-supporting. nitride semiconductor substrate. [0003] Nitride semiconductor layers are usually grown on different types of underlying substrates such as sapphire whose crystal lattices do not match well. The nitride semiconductor layer does not grow continuously epi...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L33/00H01L21/20C30B29/38C30B25/02C30B25/18C30B29/40H01L21/00H01L21/02H01L21/205H01L21/208H01L21/28H01L29/12H01L31/0256H01L33/32
CPCC30B25/02C30B25/183C30B29/40C30B29/403H01L21/0237H01L21/0242H01L21/02458H01L21/02502H01L21/0254H01L21/02642H01L33/007H01L33/16
Inventor 铃木贵征
Owner SUMITOMO CHEM CO LTD