La1-xAxMnO3 thin films and heterojunction materials grown denotatively on the silicon chip and preparing method
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- INST OF PHYSICS - CHINESE ACAD OF SCI
- Publication Date
- 2006-01-18
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to an epitaxial growth heterojunction thin film material, in particular to an epitaxial growth doped lanthanum manganate thin film and heterojunction material on a silicon chip and a preparation method. Background technique
[0002] Doped lanthanum manganate (LaMnO 3 ) is a functional material with giant magnetoresistance properties, as document 1: Ken-ichi Chahara, Toshiyuki Ohno, Masahiro Kafai and Yuzoo Kozono, Appl.Phys.Lett.63, 1990 (1993); and document 2: S .Jin, T.H.Tiefel, M.McCormack, R.A.Fastnacht, R.Ramesh, and L.H.Chen, Science 264, 423 (1994)). The material has a wide range of applications in magnetic heads, magnetic storage, sensors and magnetic control, such as literature 3: M.Rajeswari, A.Goyal, A.K.Raychaudhuri, M.C.Robson, G.C.Xiong, C.Kwon, R.Ramesh, R.L.Greene and T. Venkatesan, Appl. Phys. Lett. 69, 851 (1996). For example, Chinese Patent No.: ZL 98101982.X discloses a material with a giant magnetoresistive...