Integration manufacturing method of cantilever beam type dot needle-point based on silicon oxide film
A silicon dioxide, cantilever beam technology, used in the manufacture of microstructure devices, processes for producing decorative surface effects, gaseous chemical plating, etc., can solve the problem of high processing and manufacturing costs, cantilever beam stress bending, bending deformation and other problems, to achieve the effect of convenient and reliable process flow, improved mechanical properties, and overall performance improvement.
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Embodiment 1
[0027] A 3-inch double-sided polished (100) silicon substrate 5 with a thickness between 500 microns was oxidized for 24 hours under standard wet oxidation process conditions to form a silicon dioxide film with a thickness of about 2.1 microns.
[0028] Then use a patterned positive resist with a thickness of 3 microns as a mask, and use a conventional reactive ion etching method to pattern the silicon dioxide film layer to form the overall outline pattern of the cantilever beam-type spotting needle tip, and the etching time is 65 minutes. The cantilever beam 3 is 800 microns in length and 120 microns in width, with a single tip that narrows at an inclination angle of 30°. At the same time, the thin slit structure of the tip 4 of the spotting needle point is etched, and the slit width is 2 microns, and at the same time, a silicon dioxide window for etching the liquid storage tank 1 is formed on the front side of the silicon substrate.
[0029] Then remove the glue, and use the...
Embodiment 2
[0034] The basic process flow is the same as in Example 1, except that the process parameters are changed, wherein the oxidation time of the single crystal silicon wafer is shortened to 15 hours, and the thickness of the corresponding oxide film is 1.7 microns. The size of the spotting needle tip remains unchanged, the etching time for forming the cantilever beam pattern is 55 minutes, and other parameters are unchanged, and the spotting needle tip can also be prepared, and the trial effect is basically the same as that of Example 1.
Embodiment 3
[0036] The basic process flow is the same as that of Example 1, except that the process parameters and structural parameters are changed, wherein the oxidation time of the single crystal silicon wafer is increased to 48 hours, and the thickness of the corresponding oxide film is 2.5 microns. The individual size of the spotting needle tip is adjusted to a length of 1000 microns and a width of 200 microns. The tip still adopts a slit structure with a design size of 1.5 microns. A group of 6 forms an array, and the distance between individuals is 200 microns to form the etching of the cantilever beam pattern. The time is 90 minutes, and other parameters are kept constant, and the spotting needle tip array can be prepared, which can meet the requirements of commercial sample spotting equipment after trial use, and the spotting efficiency is significantly improved.
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