Ceramic substrate, ceramic heater, electrostatic chuck and wafer prober for use in semiconductor producing and inspecting devices
Patent Information
- Authority / Receiving Office
- US · United States
- Patent Type
- Applications(United States)
- Current Assignee / Owner
- IBIDEN CO LTD
- Publication Date
- 2005-02-10
- Estimated Expiration
- Not applicable · inactive patent
Smart Images

Figure 1 
Figure 2 
Figure 3
Abstract
Description
TECHNICAL FIELD
[0001] The present invention relates essentially to the ceramic substrate, ceramic heater, electrostatic chuck and wafer prober for semiconductor manufacture and / or inspection and more particularly to a ceramic substrate for semiconductor manufacture and / or inspection which is conducive to the prevention of electrical errors, decrease in electrostatic chucking force, generation of particles, and circuit defects. BACKGROUND ART
[0002] Semiconductor devices are manufactured through a process which comprises coating a photosensitive resin as an etching resist on a semiconductor wafer and etching the uncoated area.
[0003] While the photosensitive resin is applied in the form of a liquid to the surface of a semiconductor wafer by means of a spin coater or the like, it must be dried after coating to dissipate the solvent etc. and the thus-coated semiconductor wafer is set on a heater and heated. It is also necessary to heat the silicon wafer by, for example, sputtering. [0...