Titanium polycide stabilization with a porous barrier

Abstract

A "porous barrier" is formed without formation of a discrete barrier layer by enriching grain boundaries of a body of polysilicon with nitrogen to inhibit thermal mobility of silicon species therealong. In a polycide gate/interconnect structure, the reduced mobility of silicon suppresses agglomeration of silicon in a metal silicide layer formed thereon. Since silicon agglomeration is a precursor of a polycide inversion phenomenon, polycide inversion which can pierce an underlying oxide and cause device failure is effectively avoided. The increased thermal stability of polycide structures and other structures including a body of polysilicon thus increases the heat budget that can be withstood by the structure and increases the manufacturing process window imposed by the presence of polysilicon which can be exploited in other processes such as annealing to develop a low resistance phase of refractory metal silicide included in the polycide structure, drive-in annealing for formation of source/drain regions of field effect transistors and the like.

Description

1. Field of the InventionThe present invention generally relates to the manufacture of semiconductor devices including metal polycide processes and, more particularly, to the prevention of high resistance formations due to agglomeration and inversion in conductors and other integrated circuit structures formed at high integration density.2. Description of the Prior ArtCurrent ultra-large scale integrated circuits (ULSI), particularly those embodied in complementary metal-oxide-semiconductor (CMOS) technology, use polysilicon transistor gate electrodes capped with a low-resistance metal silicide layer. Corresponding structures may be employed for control gates of non-volatile memory cells. This combination of layers is often referred to in the art as a polycide structure. This polycide structure provides low sheet resistance in order to increase circuit performance in reducing RC time constant signal propagation delays since the interconnect resistance often limits performance of the...

AI Technical Summary

Problems solved by technology

However, these elevated temperatures have been observed to cause degradation of the low resistance properties of such fine conductors, particularly in comparison with the sheet resistance which should be achieved.

For titanium silicide, this thermal instability and degradation of conductivity is principally due to silicon agglomeration as silicon diffuses into the silicide layer from the polysilicon layer adjacent (e.g. below) it.

Since the silicon grains are of substantial resistivity, it can be appreciated that agglomerations of silicon can compromise both performance and/or manufacturing yield of the integrated circuit.

The effects may be more severe since both layers are disrupted and, at some locations, titanium may penetrate the very thin gate oxide of transistors, causing device failure.

Thus, as integration density increases and conductor cross-sectional dimensions become correspondingly smaller, the temperature and/or duration of the anneal to produce a low resistance phase of the silicide must be increased, increasing the likelihood that agglomeration and, possibly, polycide inversion, will occur.

While some processes are known which can increase the "process window" somewhat, none is fully successful f