Electrode for realizing ohmic contact with n type ZnS quasi-one-dimensional nanometer material and preparation method thereof
A technology of nano-materials and ohmic contacts, applied in circuits, electrical components, semiconductor devices, etc., to achieve mature and reliable, simple preparation process, and easy-to-control effects
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Embodiment 1
[0027] The doping concentration synthesized by chemical vapor deposition method is 1.0×10 16 cm -3 Ga-doped ZnS nanoribbons uniformly dispersed in SiO with a thickness of 300 nm 2 On the p-type heavily doped Si wafer, the bottom gate of the device is on the p-type heavily doped Si wafer, the photoresist is uniformly spin-coated, and the two-electrode electrode pattern is photo-etched. figure 1 SEM image of the device.
[0028] Using the pulsed laser deposition method, the condition is that the laser energy is 40mJ, the laser wavelength is 248nm, the pulse frequency is 20Hz, and the vacuum degree is 1×10 -5 Pa, deposit a 60nm thick AZO film on the photoetched electrode pattern. In order to further reduce the contact resistance between the AZO electrode and Ga-doped ZnS nanoribbons, the AZO electrode was vacuumed at 10 -4 Under Pa annealing, the annealing temperature is 100° C., and the time is 5 minutes. KEITHLEY 4200 semiconductor characteristic testing system was used to...
Embodiment 2
[0030] The doping concentration synthesized by chemical vapor deposition method is 2.0×10 17 cm -3 Cl-doped ZnS nanowires were uniformly dispersed in SiO with a thickness of 300 nm 2 On the p-type heavily doped Si wafer, the p-type heavily doped Si wafer is the bottom gate of the device, and the photoresist is evenly spin-coated, and the two-electrode electrode pattern is photoetched.
[0031] Using the pulsed laser deposition method, the condition is that the laser energy is 400mJ, the laser wavelength is 248nm, the pulse frequency is 1Hz, and the vacuum degree is 1×10 -2 Pa, deposit a 60nm thick AZO film on the photoetched electrode pattern. In order to further reduce the contact resistance between the AZO electrode and the Cl-doped ZnS nanowires, the AZO electrode was vacuumed at 10 -2 Under Pa annealing, the annealing temperature is 600° C., and the time is 30 minutes. The electrical transport properties of Cl-doped ZnS nanowires were tested by KEITHLEY 4200 semiconduc...
Embodiment 3
[0033] The doping concentration synthesized by chemical vapor deposition method is 6.0×10 15 cm -3 Al-doped ZnS nanoribbons uniformly dispersed in SiO with a thickness of 300 nm 2 On the p-type heavily doped Si wafer, the p-type heavily doped Si wafer is the bottom gate of the device, and the photoresist is evenly spin-coated, and the two-electrode electrode pattern is photoetched.
[0034]Using the magnetron sputtering method, the condition is that the air pressure is 1Pa, the sputtering power is 40W, and the Ar gas flow rate is 10sccm, and a 60nm thick AZO film is deposited on the photoetched electrode pattern. In order to further reduce the contact resistance between the AZO electrode and the Al-doped ZnS nanobelt, the AZO electrode was 2 The annealing is carried out under atmosphere protection, the annealing temperature is 300° C., and the annealing time is 20 minutes. The KEITHLEY 4200 semiconductor characteristic testing system was used to test the electrical transpor...
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