This invention provides an MFMIS FeFET with an intermediate
metal layer and its fabrication method, belonging to the field of micro-nano
electronics technology. The device includes a
silicon dioxide layer, a gate
metal electrode, a ferroelectric layer, an intermediate
metal layer, a
dielectric layer, an
oxide semiconductor channel layer, a source, and a drain. The
silicon dioxide layer is located above a
silicon substrate, the gate metal
electrode is located above the
silicon dioxide layer, the ferroelectric layer is attached above the gate metal
electrode, the intermediate metal layer is located above the ferroelectric layer and connected to the electrode of the intermediate metal layer via leads, the
dielectric layer is located above the intermediate metal layer, the
oxide channel layer is attached to the
dielectric layer, and the source and drain metal materials are attached to the
oxide channel layer, with the channel region between the source and drain. The potential of the intermediate metal layer can be controlled or measured through the leads and electrodes, thereby enabling
electrical testing and analysis of the device. The degradation mechanism of the storage window after durability
cycling is studied, and a
recovery waveform is applied to restore durability, thus improving durability.