Preparation method of solar cell for reutilizing diffusion oxide layer
A solar cell and oxide layer technology, which is applied in the manufacture of circuits, electrical components, and final products, can solve the problems of high boron diffusion temperature, difficult removal, deep back junctions, etc.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Examples
Embodiment 1
[0019] Select an N-type Czochralski monocrystalline silicon wafer with a doping concentration of 5Ωcm.
[0020] 1. Clean the silicon wafer, remove the damaged layer, and make the surface alkali-textured;
[0021] 2. Boron diffuses to form a P-N junction with a square resistance of 70ohm / Sq;
[0022] 3. While retaining the BSG (thickness 100nm), deposit a SiNx thin film on the front side by PECVD with a thickness of about 90nm.
[0023] 4. 20% KOH to remove the back knot, the time is 30s.
[0024] 5. Phosphorus diffuses to form a back field, and the square resistance is 30ohm / sq;
[0025] 6. Clean with 5% HF to remove the mask layer on the front side and the PSG on the back side.
[0026] 7. Plasma etching to remove edges.
[0027] 8. Al2O330nm deposited by PECVD on the front side.
[0028] 9. Anti-reflection coating SiNx 40nm deposited by PECVD on the front side.
[0029] 10. Deposit SiNx 90nm on the back side by PECVD.
[0030] 11. Printed AgAl grid lines on the front ...
Embodiment 2
[0036] Select a P-type Czochralski monocrystalline silicon wafer with a doping concentration of 1Ωcm.
[0037] 1. Clean the silicon wafer, remove the damaged layer, and make the surface alkali-textured;
[0038] 2. Phosphorus diffuses to form a P-N junction, with a square resistance of 70ohm / Sq;
[0039] 3. Preserve PSG (thickness 30nm) while depositing SiO on the front side by PECVD 2 thin film with a thickness of approximately 150 nm.
[0040] 4. 20% KOH to remove the back knot, the time is 30s.
[0041] 5. Boron diffusion forms a back field, and the square resistance is 30ohm / sq;
[0042] 6. Wash with 5% HF to remove the mask layer on the front side and the BSG on the back side.
[0043] 7. Plasma etching to remove edges.
[0044] 8. The front PECVD deposits SiNx90nm.
[0045] 9. Al2O330nm deposited by PECVD on the back;
[0046] 10. Deposit SiNx50nm on the back side by PECVD.
[0047] 11. Ag grid lines are printed on the front side;
[0048] 12. Drying;
[0049] ...
PUM
Property | Measurement | Unit |
---|---|---|
Thickness | aaaaa | aaaaa |
Thickness | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com